National Repository of Grey Literature 2 records found  Search took 0.00 seconds. 
Techniques using beam of charged particles for imaging and material analysis
Lamborová, Leona ; Kičmerová, Dina (referee) ; Čupera, Jan (advisor)
This bachelor´s thesis deals with techniques using beam of charged particles for imaging and material analysis. There are two types of charged particles that are used for this purpose, electrons and ions. This research study is divided into principles of electron optics and principles of ion optics. Further, there is mentioned function, construction and detectors used for imaging and chemical analysis of scanning electron microscopy, transmission electron microscopy and focused ion beam.
Techniques using beam of charged particles for imaging and material analysis
Lamborová, Leona ; Kičmerová, Dina (referee) ; Čupera, Jan (advisor)
This bachelor´s thesis deals with techniques using beam of charged particles for imaging and material analysis. There are two types of charged particles that are used for this purpose, electrons and ions. This research study is divided into principles of electron optics and principles of ion optics. Further, there is mentioned function, construction and detectors used for imaging and chemical analysis of scanning electron microscopy, transmission electron microscopy and focused ion beam.

Interested in being notified about new results for this query?
Subscribe to the RSS feed.