National Repository of Grey Literature 2 records found  Search took 0.01 seconds. 
Ultrathin film analysis by SIMS and TOF-LEIS
Duda, Radek ; Lörinčík, Jan (referee) ; Bábor, Petr (advisor)
Study of possibilities of thin layers depth profiling by combined use of SIMS and ToF-LEIS methods.
Ultrathin film analysis by SIMS and TOF-LEIS
Duda, Radek ; Lörinčík, Jan (referee) ; Bábor, Petr (advisor)
Study of possibilities of thin layers depth profiling by combined use of SIMS and ToF-LEIS methods.

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