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National Repository of Grey Literature 2 records found  Search took 0.01 seconds. 
Adjustment of scene for electronic devices detection
 Hynčica, Tomáš ; Honec, Peter (referee) ; Janáková, Ilona (advisor)
This work describes development of control hardware and software for automatic production of tuning fork with tip for atomic force microscopy (AFM). A specialized device implementing the problem is developed and tested. The advantage of the proposed solution is the ability to produce the tuning forks with constant parameters, which is an important condition for successful work with the microscope.
Detailed record
Adjustment of scene for electronic devices detection
 Hynčica, Tomáš ; Honec, Peter (referee) ; Janáková, Ilona (advisor)
This work describes development of control hardware and software for automatic production of tuning fork with tip for atomic force microscopy (AFM). A specialized device implementing the problem is developed and tested. The advantage of the proposed solution is the ability to produce the tuning forks with constant parameters, which is an important condition for successful work with the microscope.
Detailed record

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