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Signal analysis of transport and stochastic processes of emission detectors
Míšek, David ; Tofel, Pavel (referee) ; Andreev, Alexey (advisor)
This Diploma thesis deals with properties of CdTe detectors. This material is ranked among optical sensitive group. This thesis can be thematically divided into two basic parts. The first part describes properties of both elements and the chemical adduct. Selected properties show perfections of the material, which are specializing it to optical area of application. The end of this part contains description of contact metal-semiconductor. This problem is important to comprehension principle the material contact. In second part there were making many measurements. For more accurately compare were first measurements doing without light and then with light. During making measurement was changed wave length and temperature of sample. Key factors were Volt-Ampere characteristics and resistance result with changed temperature and wave length impact to the sample. For better accuracy measurements were done many times. All of data from measurement were cultivate by PC Easyplot programme.
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Studium elektrického pole v detektorech záření pomocí Pockelsova jevu
Hakl, Michael ; Franc, Jan (advisor) ; Richter, Ivan (referee)
Study of electric field in radiation detectors by Pockels effect (Master Thesis) by Michael Hakl Abstract Cadmium Telluride (CdTe) is a convenient candidate for room tem- perature detection of X-ray and gama radiation due to 1.5 eV band- gap energy and high atomic mass. Since CdTe has the highest linear electro-optical coefficient among II-VI compounds, the detector rep- resents a Pockels cell. Transmittance of the crystal is modulated by the internal electric field. Processing of infrared camera photographs results in an electric field profile between biasing electrodes. The elec- tric field in semi-insulting CdTe is influenced with deep level traps causing charge polarization under the electrodes. Occupation of traps is dependent on metal-semiconductor interface. Relation of charge accumulation and band bending for gold and indium contacts was studied. Repolarization/depolarization induced by additional illumi- nation with sub/above bandgap excitation laser was observed and ex- ploited for determination of the deep level energy. Results obtained by the Pockels-effect method were supported with luminescence measure- ments. Correlation between the occurrence of deep levels and surface point defects was discovered. Keywords: Pockels electro-optical effect, Cadmium Telluride ra- diation detector, Electric field, Schottky...
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Studium elektrického pole v detektorech záření pomocí Pockelsova jevu
Hakl, Michael ; Franc, Jan (advisor) ; Richter, Ivan (referee)
Study of electric field in radiation detectors by Pockels effect (Master Thesis) by Michael Hakl Abstract Cadmium Telluride (CdTe) is a convenient candidate for room tem- perature detection of X-ray and gama radiation due to 1.5 eV band- gap energy and high atomic mass. Since CdTe has the highest linear electro-optical coefficient among II-VI compounds, the detector rep- resents a Pockels cell. Transmittance of the crystal is modulated by the internal electric field. Processing of infrared camera photographs results in an electric field profile between biasing electrodes. The elec- tric field in semi-insulting CdTe is influenced with deep level traps causing charge polarization under the electrodes. Occupation of traps is dependent on metal-semiconductor interface. Relation of charge accumulation and band bending for gold and indium contacts was studied. Repolarization/depolarization induced by additional illumi- nation with sub/above bandgap excitation laser was observed and ex- ploited for determination of the deep level energy. Results obtained by the Pockels-effect method were supported with luminescence measure- ments. Correlation between the occurrence of deep levels and surface point defects was discovered. Keywords: Pockels electro-optical effect, Cadmium Telluride ra- diation detector, Electric field, Schottky...
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Signal analysis of transport and stochastic processes of emission detectors
Míšek, David ; Tofel, Pavel (referee) ; Andreev, Alexey (advisor)
This Diploma thesis deals with properties of CdTe detectors. This material is ranked among optical sensitive group. This thesis can be thematically divided into two basic parts. The first part describes properties of both elements and the chemical adduct. Selected properties show perfections of the material, which are specializing it to optical area of application. The end of this part contains description of contact metal-semiconductor. This problem is important to comprehension principle the material contact. In second part there were making many measurements. For more accurately compare were first measurements doing without light and then with light. During making measurement was changed wave length and temperature of sample. Key factors were Volt-Ampere characteristics and resistance result with changed temperature and wave length impact to the sample. For better accuracy measurements were done many times. All of data from measurement were cultivate by PC Easyplot programme.
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