National Repository of Grey Literature 8 records found  Search took 0.00 seconds. 
Depth profiling of multilayers by LEIS
Strapko, Tomáš ; Duda, Radek (referee) ; Bábor, Petr (advisor)
Diplomová práce se zabývá vytvořením modelu, který by umožnil lepší interpretaci hloubkových profilů měřených metodou LEIS. Obtížnost interpretace těchto profilů je dána vysokým podílem vícenásobně odražených projektilů v meřených spektrech. Tyto projektily nepřináší užitečnou informaci z dané hloubky. Naproti tomu jednonásobně odražené projektily nesou přesnější informaci o složení a tloušťce vrstev. V této práci vytvořený model se snaží určit příspěvek jednonásobně odražených částic k celkovému tvaru spektra a na základě něj i hloubkový profil vzorku.
Analysis of Nanostructures by ToF-LEIS
Duda, Radek ; Král, Jaroslav (referee) ; Mašek, Karel (referee) ; Dub, Petr (advisor)
The presented thesis deals with the utilization of TOF-LEIS analytical method in the area of nanostructure analysis. A new procedure for depth profiling of the elemental composition of the sample, based on the alternate measurement with the DSIMS method, was established. The TOF-LEIS method is able to detect the interface between the layers before its mixing by the ion beam of the DSIMS method. Furthermore, a procedure of TOF-LEIS spektra modification was established to obtain the actual concentration of elements in the sample by reduction of a multiple collision contribution. By comparison of TOF-LEIS spectra with the results received by the DSIMS method the ratio of molybdenum and silicon ion yields was obtained. In the next section advantages of the TOF-LEIS method in combination with XPS during analysis of thermal stability of gold nanoparticles are presented. The mutual complementarity of both methods is shown and final conclusions are supported by electron microscopy images. The final section deals with a newly assembled apparatus for the TOF-SARS analytical method and shows its possibilities regarding the detection of hydrogen on the graphene.
Ultrathin film analysis by SIMS and TOF-LEIS
Duda, Radek ; Lörinčík, Jan (referee) ; Bábor, Petr (advisor)
Study of possibilities of thin layers depth profiling by combined use of SIMS and ToF-LEIS methods.
Depth profiling of multilayers by LEIS
Strapko, Tomáš ; Duda, Radek (referee) ; Bábor, Petr (advisor)
Diplomová práce se zabývá vytvořením modelu, který by umožnil lepší interpretaci hloubkových profilů měřených metodou LEIS. Obtížnost interpretace těchto profilů je dána vysokým podílem vícenásobně odražených projektilů v meřených spektrech. Tyto projektily nepřináší užitečnou informaci z dané hloubky. Naproti tomu jednonásobně odražené projektily nesou přesnější informaci o složení a tloušťce vrstev. V této práci vytvořený model se snaží určit příspěvek jednonásobně odražených částic k celkovému tvaru spektra a na základě něj i hloubkový profil vzorku.
The analysis of the game performance of Slovenia team on European championships 2017
Duda, Radek ; Velenský, Michael (advisor) ; Kaprálek, Tomáš (referee)
Bachelor's Thesis title: Analysis of the game performance of the Slovenian national team at the European Championship Basketball 2017 Aim of thesis: The main aim of the work is to find those performance gauges that contributed to the Slovenian's triumph in the European Championship 2017 tournament. With using mathematical operations to find differences in game performances of Slovenia national team and its opponents. Methods: Quantitative video analysis and secondary data analysis were used to collect data. Results: Final analysis of the resulting data shows that Slovenian team outplayed their opponents mainly in one on one situations which lead to drawing personals fouls and a lot of free throws attempts. The Slovenian national team shot with 64 % success rate including free throws. Key words: Game performance, basketball, Slovenia, European Championship 2017
The efficiency of free throws in relation to the game results in the highest men's basketball league in Czech Republic
Duda, Radek ; Velenský, Michael (advisor) ; Kaprálek, Tomáš (referee)
Bachelor's thesis title: The efficiency of free throws in relation to the game results in the highest men's basketball league in Czech Republic. Aim of thesis The main purpose of this work is to find out how much can successful and unsuccessful free throws affect basketball game by finding differences between the winning and the losing team by using basic statistical calculations. Methods: In my work I used the method of secondary analysis and basic statistical calculations. Significance of the method of secondary analysis is to analyze data which has been collected by someone else and use them to gain new, previously unevaluated information. Results: Carried out the research I discovered what free throw percentage the winning and the losing teams have. The winning teams have a 3% higher success rate of shooting free throws. Key words: success rate of shooting, differences, victory
Analysis of Nanostructures by ToF-LEIS
Duda, Radek ; Král, Jaroslav (referee) ; Mašek, Karel (referee) ; Dub, Petr (advisor)
The presented thesis deals with the utilization of TOF-LEIS analytical method in the area of nanostructure analysis. A new procedure for depth profiling of the elemental composition of the sample, based on the alternate measurement with the DSIMS method, was established. The TOF-LEIS method is able to detect the interface between the layers before its mixing by the ion beam of the DSIMS method. Furthermore, a procedure of TOF-LEIS spektra modification was established to obtain the actual concentration of elements in the sample by reduction of a multiple collision contribution. By comparison of TOF-LEIS spectra with the results received by the DSIMS method the ratio of molybdenum and silicon ion yields was obtained. In the next section advantages of the TOF-LEIS method in combination with XPS during analysis of thermal stability of gold nanoparticles are presented. The mutual complementarity of both methods is shown and final conclusions are supported by electron microscopy images. The final section deals with a newly assembled apparatus for the TOF-SARS analytical method and shows its possibilities regarding the detection of hydrogen on the graphene.
Ultrathin film analysis by SIMS and TOF-LEIS
Duda, Radek ; Lörinčík, Jan (referee) ; Bábor, Petr (advisor)
Study of possibilities of thin layers depth profiling by combined use of SIMS and ToF-LEIS methods.

See also: similar author names
1 Duda, Radim
2 Duda, Roman
1 Ďuďa, Rudolf
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