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National Repository of Grey Literature 11 records found  previous11 - 11  jump to record: Search took 0.01 seconds. 
Accuracy of internal and external standard method in quantitative analysis by X-ray powder diffraction
 Pérez-Estébanez, Marta ; Viani, Alberto
The X-ray powder diffraction method is known to convey information on the phase composition of samples. Obtaining an accurate quantification of these phases has been long precluded. With the advent of the Rietveld method [1] this became possible. Hedemonstrated the possibility to extract accurate structural information from neutron powder diffraction data. Later, his approach has been extended to x-ray powder diffraction data with successful results. The basics of the Rietveld method lays on the complete exploitation of the whole powder profile without extracting the integrated intensities. The structural information are obtained by fitting the entire profile of the measured diffraction pattern to a calculated diffraction profile. The refinement procedure implements the least square regression and it requires a reasonable scheme of starting values that approximate the real datum.
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