Národní úložiště šedé literatury Nalezeno 1 záznamů.  Hledání trvalo 0.00 vteřin. 
Characterization of industrial materials by slow and very slow electrons
Mikmeková, Šárka ; Müllerová, Ilona ; Frank, Luděk
Progress in materials science and engineering is inseparably connected with excellent knowledge of the correlation between materials properties and their microstructure. In our experiment an ultra-high vacuum scaning low energy electron microscope (UHV SLEEM) of an in-house design was used to observe microstructure of specimens. The UHV SLEEM is equipped with the cathode lens (CL) assembly, which enables us to observe samples at arbitrary landing energies of primary electrons. The device provides argon ion beam for in-situ cleaning of the specimen surface.

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