National Repository of Grey Literature 128 records found  beginprevious128 - 128  jump to record: Search took 0.01 seconds. 
Meření tvaru křemíkových desek pomocí interferometrie v bílém světle
Pavlíček, Pavel ; Chmelíčková, Hana
The form of silicon wafer is measured by white-light interferometry with measurement uncertainty about 1 μm. In this way waviness or deviations of the silicon wafers can be measured.

National Repository of Grey Literature : 128 records found   beginprevious128 - 128  jump to record:
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