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Crystal field by the means of single-crystal Time of Flight scattering
 Venclík, Štěpán ; Čermák, Petr (advisor) ; Klicpera, Milan (referee)
Crystal electric field has been studied since the 1970s using inelastic neu- tron spectrometry. A simple one-day time-of-flight measurement on pow- dered samples is often used. This thesis aims to demonstrate a method of determination of the crystal electric field parameters based on the data ob- tained from neutron time-of-flight spectrometer on a single crystal. A single crystal of the intermetallic compound PrNi5 was successfully prepared us- ing the floating zone furnace and characterised using XRD, EDX, and Laue diffraction. The time-of-flight scattering on the single crystal was conducted using HYSPEC at ORNL. A Monte Carlo calculation was carried out based on the scattering data to determine the crystal electric field parameters. The usefulness of the time-of-flight scattering on a single crystal for crystal electric field determination, particularly for systems with many crystal field levels, was shown. 1
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