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High Temperature Processes in Silicon Solar Cells Production
Frantík, Ondřej ; Hudec, Lubomír (referee) ; Banský,, Juraj (referee) ; Szendiuch, Ivan (advisor)
The thesis is focused on high temperature processes in crystalline solar cells production. Main topic is diffusion of traditional dopants phosphorus and boron. Diffusion processes for creating solar cells are different from classical diffusion in semiconductor industrial. It is reason why the thesis describes crated layers in detail. Knowledge of diffusion processes is used for creating bifacial solar cells and development of a new phosphorus emitter for conventional solar cells. Bifacial cells are a new type of cells. Developed new emitter increases efficiency and decreases cost of solar cells production. Another part the thesis is devoted to the prediction of diffusion processes. New models of phosphorus and boron diffusion for photovoltaic industrial are created in software SILVACO. Models correspond with real results.
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Luminescence Diagnostic of Photovoltaic Cells
Stojan, Radek ; Frantík, Ondřej (referee) ; Šály,, Vladimír (referee) ; Vaněk, Jiří (advisor)
Diagnostic of photovoltaic cells defects is one of the key step in production. This dissertation thesis deals about diagnosis of photovoltaic cells by radiative recombination of electron - hole pairs. This radiative recombination is known as luminescence. Diagnostic methods using this local light emission in infrared region have innovative potential. The method of electroluminescence is one of the most widely used luminescence methods whose modifications are applied across the industry, especially in semiconductors. The main area of this thesis research is focused on non-destructive analysis of radiated infrared radiation of monocrystalline and polycrystalline solar cells in various modifications of standard electroluminescence method. In this research there are used two types of CCD cameras are used as luminescent radiation detectors. Method of photon emission microscopy is used for magnification element. Local light emission inspection by microscopy should have benefit to qualitative evaluation of solar cells defects. Radiation emitted by the solar cell has a wave character. This fact brings the potential of using some of the characteristics of the waves. We are talking about the intensity and mainly about new characterization by polarization during the detection of defects in the solar cell surface. Innovation of the measuring workplace of the standard electroluminescence method to use polarization analysis is one of the goals of this dissertation thesis.
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Elimination of defects in Si substrates by Rapid Thermal Process application
Frantík, Ondřej ; Hégr, Ondřej (referee) ; Szendiuch, Ivan (advisor)
Low cost, rapid and high thermal by IR heating, rapid cooling and high efficiency, there are RTP (Rapid Thermal Processing) properties. We can use RTP for annealing, diffusion, contacting, oxidation and others. Rapid temperature change and IR heating can be followed positive effects in the silicon substrate. This paper is focused on annealing by RTP. Wafers were p-type monocrystalline CZ silicon with different bulk minority carrier lifetime. Minority carrier lifetime was measured by MW-PCD (Microwave Photoconductance Decay) before and after thermal processing.
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Luminescence Diagnostic of Photovoltaic Cells
Stojan, Radek ; Frantík, Ondřej (referee) ; Šály,, Vladimír (referee) ; Vaněk, Jiří (advisor)
Diagnostic of photovoltaic cells defects is one of the key step in production. This dissertation thesis deals about diagnosis of photovoltaic cells by radiative recombination of electron - hole pairs. This radiative recombination is known as luminescence. Diagnostic methods using this local light emission in infrared region have innovative potential. The method of electroluminescence is one of the most widely used luminescence methods whose modifications are applied across the industry, especially in semiconductors. The main area of this thesis research is focused on non-destructive analysis of radiated infrared radiation of monocrystalline and polycrystalline solar cells in various modifications of standard electroluminescence method. In this research there are used two types of CCD cameras are used as luminescent radiation detectors. Method of photon emission microscopy is used for magnification element. Local light emission inspection by microscopy should have benefit to qualitative evaluation of solar cells defects. Radiation emitted by the solar cell has a wave character. This fact brings the potential of using some of the characteristics of the waves. We are talking about the intensity and mainly about new characterization by polarization during the detection of defects in the solar cell surface. Innovation of the measuring workplace of the standard electroluminescence method to use polarization analysis is one of the goals of this dissertation thesis.
|
|
|
High Temperature Processes in Silicon Solar Cells Production
Frantík, Ondřej ; Hudec, Lubomír (referee) ; Banský,, Juraj (referee) ; Szendiuch, Ivan (advisor)
The thesis is focused on high temperature processes in crystalline solar cells production. Main topic is diffusion of traditional dopants phosphorus and boron. Diffusion processes for creating solar cells are different from classical diffusion in semiconductor industrial. It is reason why the thesis describes crated layers in detail. Knowledge of diffusion processes is used for creating bifacial solar cells and development of a new phosphorus emitter for conventional solar cells. Bifacial cells are a new type of cells. Developed new emitter increases efficiency and decreases cost of solar cells production. Another part the thesis is devoted to the prediction of diffusion processes. New models of phosphorus and boron diffusion for photovoltaic industrial are created in software SILVACO. Models correspond with real results.
|
|
|
Elimination of defects in Si substrates by Rapid Thermal Process application
Frantík, Ondřej ; Hégr, Ondřej (referee) ; Szendiuch, Ivan (advisor)
Low cost, rapid and high thermal by IR heating, rapid cooling and high efficiency, there are RTP (Rapid Thermal Processing) properties. We can use RTP for annealing, diffusion, contacting, oxidation and others. Rapid temperature change and IR heating can be followed positive effects in the silicon substrate. This paper is focused on annealing by RTP. Wafers were p-type monocrystalline CZ silicon with different bulk minority carrier lifetime. Minority carrier lifetime was measured by MW-PCD (Microwave Photoconductance Decay) before and after thermal processing.
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