|
|
Development of probes for combined magnetic force microscopy and electron microscopy
Láznička, Tomáš ; Švarc, Vojtěch (referee) ; Pavera, Michal (advisor)
This thesis deals with the production of magnetic probes for Magnetic Force Microscopy. For production, it was necessary to construct a device that can be used to make magnetic probes from commercial AFM probes. The requirements for the holder for deposition are specified, mechanical designs of six proposals which have been improved are discussed and further is described a production of magnetic probes. In a special chapter are shown deposited material on probe tips surface and results of testing magnetic probes.
|
|
|
Local electrical conductivity measurements in AFM tapping mode
Dao, Radek ; Konečný, Martin (referee) ; Pavera, Michal (advisor)
This bachelor thesis is concerned about the development of a probe for local electrical conductivity measurements in tapping mode Atomic Force Microscopy. The teoretical part gives a short overview of Scanning Probe Microscopy techniques, with the focus being on Conductivity Atomic Force Microscopy. Furthermore, the measuring regime in which the probe operates is described here, as well as the basic component of the probe, the quartz tuning fork. The experimental part follows the iterative development process, and contains a chapter dedicated to making of very sharp tips. The final chapters describe the preparation of test samples, which were used to prove the functionality of the probe and the measurement of local electrical conductivity itself.
|
|
|
Low temperature scanning tunneling microscopy
Sojka, Antonín ; Havlíček,, Marek (referee) ; Pavera, Michal (advisor)
The diploma thesis is divided into two main parts. The first part describes the production of chrome and cobalt tips for SP-STM with subsequent testing of chrome tips on the Fe-Ir system (111). Furthermore, the first results from the growth studies of niobium on iridium(111) are presented. In the second part is described in detail the experimental LT-STM microscope of the Faculty of Physical Engineering. The chapter deals with the development of the microscope and its testing on a HOPG sample under atmospheric and vacuum conditions. The chapter describes the biggest problems which were solved when the microscope was puting into operation state. The second part also introduces the design of a new vacuum transport system, which consists of a tip and sample transport pallet. At the end of the second part is described the testing of cooling systems for LT-STM and the design of their modifications.
|
|
|
Preparation and testing of SNOM probes
Bobek, Juraj ; Pavera, Michal (referee) ; Spousta, Jiří (advisor)
The area of research that deals with surface modification and preparation of nanostructures is still very unexplored. And only a little contribution to this field is discussed in this bachelor thesis. Its goal is to manufacture and to test a probe made off hollow optical fibre that is used in Scanning Probe Microscopy. Optical fibre parameters in combination with proper and unique techniques allow the breakthrough off very interesting applications. It's worth mentioning the gas injection in the proximity of the surface of a sample (GIS) and thus its modification by use of electrons (FEBID), ions (FIBID) or laser beams.
|
|
|
Development of the sample holder for electrical diagnostics in UHV SEM
Axman, Tomáš ; Pavera, Michal (referee) ; Bábor, Petr (advisor)
This bachelor thesis focuses on design and testing of a sample holder enabling for cooling and heating of the sample in ultra-high vacuum apparatus for scanning electron microscope, developed in cooperation with Tescan company. In the theoretical part the currently used sample holders in similar UHV systems are described and their positives and negatives are discussed including material selection. The experimental part describes designing of the sample holder with respect to the required number of electrical contacts for measuring electrical properties of the samples and UHV compatibility. Measurement and testing of the manufactured sample at low and high temperatures is presented.
|
|
|
Design of Low-Temperature Ultra High Vacuum Scanning Probe Microscopes
Pavera, Michal ; Klapetek, Petr (referee) ; Vetushka, Aliaksei (referee) ; Šikola, Tomáš (advisor)
This thesis deals with the development of scanning probe microscopes. Mechanical requirements for microscopes using measuring methods of scanning tunneling microscopy (STM) and atomic force microscopy (AFM) under enviroments of an ultrahigh vacuum (UHV) and variable temperatures are specified. Mechanical designs of two microscopes are discussed and their control electronics described. A special chapter is devoted to description of linear piezo manipulators and mechanical design of these prototypes.
|
|
|
Design of the supporting platform for low temperature UHV STM microscope
Dao, Tomáš ; Křupka, Ivan (referee) ; Pavera, Michal (advisor)
Diploma thesis deals with the design of a vibration isolated platform for low temperature scanning tunneling microscope working under ultra high vacuum (UHV STM). Cooling of the microscope is done by liquid helium using a flow cryostat designed in Institute of Scientific Instruments of the AS CR. In the thesis, general requirements of designing of an ultra high vacuum compatible devices are discussed, as well as the ways of vibrational isolation and damping. Also some ways how to restrict the transfer of vibration between vacuum devices and surroundings are mentioned. This knowledge is then applied to the design of the antivibrational microscope platform compatible with low temperature usage. For better understanding of vibrational transfer and damping, a real model of the designed platform is made and vibrational transfer characteristics are measured and compared with the theory.
|
|
|
Automation and control of multilayers deposition by IBS/IBAD
Pavera, Michal ; Sobota, Jaroslav (referee) ; Urbánek, Michal (advisor)
This diploma thesis deals with the automation of the deposition process by ion beam sputtering and ion beam assisted deposition. This work contains drawings of mechanical adjustments of the deposition chamber designed to control shutter and rotation of the target using stepper motors. There are presented ways to control stepper motors and troubleshoot their exact settings. Another task is to design a system for computer control of the deposition process. There are discussed ways to control the ion sources, pressure meter, flow meter and thickness meter, and their connection to a PC via RS-232 and analog-digital converters. It is also designed control program in LabVIEW, which allow automated multilayer deposition. Last part of the thesis deals with testing automatic deposition and results are commented.
|
|
|
The deposition of thin films by the ion sputtering IBS/IBAD
Hudeček, Jan ; Pavera, Michal (referee) ; Dvořák, Petr (advisor)
The submitted bachelor’s thesis are dealed with concept and design of holder of new palette, which is determine for deposition equipment, which belongs to institue of physical engineering and which is called as Kaufmann. Introductory chapters of bachelor’s thesis deals about possibilities of production of thin films, ways of growth of thin films and introduction to vakuum physics. Next chapter is given to current deposition and current deposition equipment Kaufmann. In the next chapter are descriptions of construct solution of holder of new palette and construct solution of palette. The last chapter is given to calibration and optimalization of deposition with new palette.
|
|
|
Assembling and testing of low temperature STM microscope
Sojka, Antonín ; Páleníček, Michal (referee) ; Pavera, Michal (advisor)
This bachelor thesis addresses the problem of assebling the low temperature STM working in ultrahigh vacuum. The thesis deals with connecting the microscope and electronics. The desing of temperature stabilizers for fixing the low temperatures is described along with a construction of expanding the vacuum chamber to test STM in low temperatures. The thesis describes the construction of sample and tip holders to insert samples and tips into the STM. At the end there are brief instructions to use GXSM software and testing the microscope in atmospheric pressure.
|
guest ::
