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Rapid Thermal Processing
Korvas, Jan ; Boušek, Jaroslav (referee) ; Mojrová, Barbora (advisor)
This work is focused on technologies using rapid thermal processes (RTP) to improve technological procedures. Main reasons of implementation of RTP technologies has been financial and time-consuming nature of regular procedures. The scale of utilization of RTP in the electro-technical industry is very wide, starting with simple operations like contacting up to more complicated ones like oxidation in inert atmospheres. This thesis captures a development of those procedures with a focus on fabrication of solar cells. The experimental part is focused on a draft of equipment for bonding of solar cells using short wave and middle wave infrared heaters. This thesis is being created in cooperation with the company Solartec, s. r. o.
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Fixed-charge examination by surface energy measurement
Mojrová, Barbora ; Boušek, Jaroslav (referee) ; Hégr, Ondřej (advisor)
This work is deal with development of alternative method measuring fixed charge in thin dielectric layers by surface tension. Presence fixed charge takes effect so-called Back Surface Field (BFS), which helps to decrease surface recombination velocity on back side of solar cell. In work is described experimental measuring on dielectric layers Al2O3, AlN, SiNx, Y2O3 and PSG deposit on crystalline silicon wafers. Surface tension (it is the same like surface free energy) is analyzed from contact angle size using See System.
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A light source with variable intensity
Koždoň, Jakub ; Mojrová, Barbora (referee) ; Boušek, Jaroslav (advisor)
This work is focused on description how the light impact human live, description of light sources and finally design and construction of light source with adjustable colour temperature and luminous flux. In introduction is mentioned the process of vision and how the light impact humans. In next part is characterization of currently used light sources, their construction, properties, benefits and drawback with their main parameters. Important part of this chapter is more extensive description of light emitting diodes with their operational parameters. The last two parts is focused on design and measuring the parameters of created light source with adjustable colour temperature and luminous flux and evaluating the results.
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The Use of AFM Measurement Method in Crystalline Silicon Solar Cells Technology
Mojrová, Barbora ; Boušek, Jaroslav (referee) ; Hégr, Ondřej (advisor)
This thesis deals with the use of Atomic Force Microscopy (AFM) and Kelvin Probe Force Microscopy (KPFM) in solar cells production. Both techniques measure surface properties using interactions between surface and tip that progressively scans entire surface of the sample. Atomic force microscopy allows three dimensional imaging of surface structure. Kelvin probe force microscopy is used to measure the contact potential difference on the sample surface. There are described experimental measurements of monocrystalline and multicrystalline substrates after various etching processes using AFM. By using KPFM the contact potential difference was measured on dielectric layers PSG, SiOX, SiNX and Al2O3 and on selective emitter structures. All experiments described in this work were carried out at the Solartec Ltd. workplace and they completely correspond with the actual technology of crystalline solar cells production.
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