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GAP analysis of information security management system
Konečný, Martin ; Tomáš,, Krejčí (referee) ; Sedlák, Petr (advisor)
The master’s thesis focuses on GAP analysis of information security management system. The thesis consists of theoretical, analytical and practical part. The first part discusses the theoretical background of the issue of information and cyber security. The analytical part describes the current condition of the researched company. The thesis’s output is the draft of risk register and draft of security countermeasures implementation. The draft targets on countermeasures leading to increase information security in company.
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Information System for Schools
Kupský, Michal ; Konečný, Martin (referee) ; Kříž, Jiří (advisor)
Bachelor's thesis describes the design of an information system for schools. In the first part of my work I will describe the theoretical basis for this work. The following section will focus on present situation analysis, which will present the actual communication styles of schools with children parents. In third part I describe the design of database system, which should simplify and improve awareness of parents on study results and behavior of their children.
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Application of KPM on Graphene/Si Surface Modified by FIB method
Konečný, Martin ; Rezek, Bohuslav (referee) ; Bartošík, Miroslav (advisor)
This diploma thesis is focused on the application of Kelvin probe microscopy on graphene fabricated by the chemical vapour deposition. The theoretical part of the thesis deals with basic principles of Kelvin force microscopy and focus ion beam. Further, basic properties of graphene and its possible fabrication methods are discussed. The experimental part is focused on the surface potential measurements on graphene membranes fabricated on the substrate modified by focus ion beam. Finally, atomic force microscope lithography was used for nanopatterning of graphene sheets.
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Application of Scanning Probe Microscope in Nanoscience and Nanotechnology
Konečný, Martin ; Klapetek, Petr (referee) ; Fejfar, Antonín (referee) ; Bartošík, Miroslav (advisor)
Tato doktorská práce se zabývá rastrovací sondovou mikroskopií (Scanning Probe Microscopy – SPM) a jejím využitím v nanovědách a nanotechnologiích. Konkrétně je zde kladem důraz především na pokročilé techniky mikroskopie atomárních sil (Atomic Force Microscopy – AFM), jako je Kelvinova silová mikroskopie (Kelvin Probe Force Microscopy – KPFM) a vodivostní AFM. Samotné aplikace těchto technik jsou dále zaměřené zejména na oblast výzkumu grafenu. V práci je nejprve stručně rozebrán princip fungování SPM a následně jsou diskutovány jednotlivé aplikace AFM a KPFM zaměřené na charakterizaci vlastností jak samotného gafenu, tak i zařízeních fungujících na jeho bázi. Dále se práce zabývá možnostmi využití AFM integrovaného v jednom zařízení spolu se rastrovacím elektronovým mikroskopem (Scanning Electron Microscopy - SEM). Z tohoto přehledu vyplývají čtyři hlavní témata doktorského výzkumu, které se věnují studiu přesunu elektrikého náboje mezi grafenovými nanostrukturami, přípravě a charakterizaci hydrogenovaného grafenu a grafen-kovových hybridních struktur s uplatněním v biosensorice. Aspekty jednotlivých témat jsou následně podrobně rozebrány a podpořeny adekvátními experimentálními výsledky. Na závěr jsou nastíněny plány budoucího výzkumu týkajícího se těchto čtyř témat
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Local electrical conductivity measurements in AFM tapping mode
Dao, Radek ; Konečný, Martin (referee) ; Pavera, Michal (advisor)
This bachelor thesis is concerned about the development of a probe for local electrical conductivity measurements in tapping mode Atomic Force Microscopy. The teoretical part gives a short overview of Scanning Probe Microscopy techniques, with the focus being on Conductivity Atomic Force Microscopy. Furthermore, the measuring regime in which the probe operates is described here, as well as the basic component of the probe, the quartz tuning fork. The experimental part follows the iterative development process, and contains a chapter dedicated to making of very sharp tips. The final chapters describe the preparation of test samples, which were used to prove the functionality of the probe and the measurement of local electrical conductivity itself.
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Rapid scan EPR spectroscopy on DNP relevant radicals
Fargač, Tomáš ; Konečný, Martin (referee) ; Sojka, Antonín (advisor)
Electron paramagnetic resonance (EPR) spectroscopy is a Physico-chemical method used to investigate substances with unpaired electrons. It investigates the distribution of spin energies of an unpaired electron in a magnetic field and the transitions between individual spin states caused by the action of microwave radiation. This bachelor thesis is focused on the description of EPR spectroscopy, the calculation of relaxation times using the rapid scan method on radicals and the development of automatic coupling software for Gaussian beam coupling. The result of this work is the implementation of the developed software, evaluation of its influence on the signal quality and subsequent calculation of relaxation times.
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Computer Network in Modern House
Konečný, Martin ; Jordán, Vilém (referee) ; Ondrák, Viktor (advisor)
This bachelor thesis deals with the design of computer networks for a modern house and a separate office building. It is based on the analysis of the construction project. Thesis reflects all the specified procedures and elements of the project, which will be used for implementation. Technical documentation and cost analysis are also included in the thesis.
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Use of a special optical fiber in an electron microscope chamber
Černek, Ondrej ; Konečný, Martin (referee) ; Pavera, Michal (advisor)
This bachelor thesis is concerned about the modification of vacuum chamber of the Scanning Electron Microscope VEGA developed by TESCAN Brno s.r.o. in order to implementation of Scanning Probe Microscope. Moreover, it is dedicated to development of apparatus for using hollow optical fiber allowing the guidance of light and various gases on the sample surface placed in the vacuum of electron microscope. By using the hollow optical fiber as a probe of Scanning Probe Microscope, it is possible to work with a tip with specific properties. A brief introduction to Scanning Electron Microscopy and Atomic Force Microscopy is presented in the theoretical part. Furthermore, there is a technique of using optical fibers in Scanning Near-field Optical Microscopy described. Also a problem of vacuum systems, gas flow through the pipe and technique of Gas Injection System is introduced. In the construction part, there are initiated steps in the development of the vacuum chamber and the apparatus allowing the guidance of hollow optical fiber into the chamber of microscope. The experimental part presents the result of measurements obtained by probe of Scanning Probe Microscope with modified optical fiber and gas transmissivity of hollow optical fiber.
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