National Repository of Grey Literature 1 records found  Search took 0.01 seconds. 

Pozorování vícevrstvých polovodičových struktur v rastrovacím elektronovém mikroskopu
Wandrol, Petr ; Matějková, Jiřina ; Autrata, Rudolf
This work deals with problems related to the observation of semiconductor specimens in the scanning electron microscope. It was found that the best method for the localization of defects in the semiconductor structure cross sections is the imaging of their material contrast by the scintillation detector of backscattered electrons. This detector also can effectively suppress the influence of specimen charging on the image.

Interested in being notified about new results for this query?
Subscribe to the RSS feed.