|
|
Advanced electron diffraction methods for structural description of zeolites
Laštovičková, Anna ; Mazur, Michal (advisor) ; Tyrpekl, Václav (referee)
Electron diffraction (ED) is a powerful tool for the structure determination of crystalline materials. It offers an alternative to single crystal X-ray diffraction (SCXRD) that is often limited by the size of synthesized crystals. Electron diffraction allows analysis of materials at the nanoscale, thus it is particularly useful for samples which crystals are too small for other methods. ED utilizes electrons for collection of diffraction patterns that can be performed in a transmission electron microscope (TEM). Collected ED patterns are further analyzed allowing for the determination of unit cell parameters, lattice type, and even the crystal structure itself. Nevertheless, the effective structure determination from standard ED patterns requires in-depth expertise and data collection is time consuming. Current development of ED methods focuses on the facilitation and automatization of data collection and processing. Notably, highly advanced, continuous rotation electron diffraction (cRED) data collection takes only a few minutes enabling structure determination within a single day. In this work, I present the utilization of cRED method for the structural characterization of zeolites. These materials are often synthesized as polycrystalline samples with crystals of nanometer in size. This makes...
|
|
|
Correlation of electron backscatter diffraction for elastic stress mapping
Ondračka, Václav ; Kuběna, Ivo (referee) ; Spousta, Jiří (advisor)
Electron backscatter diffraction is a method that is well described and commonly used for orientation image mapping, including grain size estimation. The use of this method for measuring elastic deformation and rotations caused by plastic deformations is not so well decribed. This diploma thesis first describes the typical EBSD system. The information regarding the standard coordinate systems, grain orientation notation and system calibration is then used to create an open-source software for mapping elastic deformations and rotations inside a single grain or a monocrystal. This software uses data acquired during standard EBSD mapping on a commercial system.
|
|
|
Correlation of electron backscatter diffraction for elastic stress mapping
Ondračka, Václav ; Kuběna, Ivo (referee) ; Spousta, Jiří (advisor)
Electron backscatter diffraction is a method that is well described and commonly used for orientation image mapping, including grain size estimation. The use of this method for measuring elastic deformation and rotations caused by plastic deformations is not so well decribed. This diploma thesis first describes the typical EBSD system. The information regarding the standard coordinate systems, grain orientation notation and system calibration is then used to create an open-source software for mapping elastic deformations and rotations inside a single grain or a monocrystal. This software uses data acquired during standard EBSD mapping on a commercial system.
|
guest ::
