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Application of correlative AFM/SEM microscopy
Hegrová, Veronika ; Fejfar, Antonín (referee) ; Konečný, Martin (advisor)
This thesis is dealing with application of Correlative Probe and Electron Microscopy. All measurements were carried out by atomic force microscope LiteScope which is designed especially to be combined with electron microscopes. Advantages of Correlative AFM/SEM Microscopy are demonstrated on selected samples from field of nanotechnology and material science. Application of the correlative imaging was proposed and then realized particularly in case of low-dimensional structures and thin films. Further, this thesis deals with the possibility of combining Correlative AFM/SEM Microscopy with other integrated techniques of an electron microscope such as Focused Ion Beam and Energy Dispersive X-rays Spectroscopy.
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Photoluminiscence study of thin layers of MoS2
Kuba, Jakub ; Kunc,, Jan (referee) ; Bartoš, Miroslav (advisor)
The thesis deals with study of thin layers of transition metal dichalcogenides, especially of molybdenum disulfide. Nanostructures were fabricated on two-dimensional crystals of MoS2 and WSe2. Within followed analysis attention was paid to the photoluminescence properties. In the thesis transition metal dichalcogenides are reviewed and description of the modified process of preparation by micromechanical exfoliation is given.
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In-situ microscopy in corrosive environment
Nedvěd, Matěj ; Velický, Matěj (referee) ; Kolíbal, Miroslav (advisor)
This diploma thesis focuses on in-situ electron microscopy and its application to monitoring the chemical reactions on the surfaces of nanomaterials. The possibilities offered by this technique are presented, and the existing solution of an in-situ scanning electron microscope used for experiments is described. The thesis introduces Janus two-dimensional materials based on transition metal dichalcogenides with a focus on their preparation. A detailed description follows regarding the preparation of thin layers of WSe2 material using mechanical exfoliation and experiments conducted using an in-situ microscope. These experiments involved annealing of WSe2 material in the presence of hydrogen sulfide (H2S) while simultaneously observing it with an electron microscope, aimed to facilitate the chalcogenide exchange in this material. The morphology, composition, and optical properties of the material were subsequently analyzed using Raman spectroscopy and photoelectron spectroscopy. Finally, an experiment resulting in the successful exchange of selenium in WSe2 for sulphur is presented.
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Application of correlative AFM/SEM microscopy
Hegrová, Veronika ; Fejfar, Antonín (referee) ; Konečný, Martin (advisor)
This thesis is dealing with application of Correlative Probe and Electron Microscopy. All measurements were carried out by atomic force microscope LiteScope which is designed especially to be combined with electron microscopes. Advantages of Correlative AFM/SEM Microscopy are demonstrated on selected samples from field of nanotechnology and material science. Application of the correlative imaging was proposed and then realized particularly in case of low-dimensional structures and thin films. Further, this thesis deals with the possibility of combining Correlative AFM/SEM Microscopy with other integrated techniques of an electron microscope such as Focused Ion Beam and Energy Dispersive X-rays Spectroscopy.
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Photoluminiscence study of thin layers of MoS2
Kuba, Jakub ; Kunc,, Jan (referee) ; Bartoš, Miroslav (advisor)
The thesis deals with study of thin layers of transition metal dichalcogenides, especially of molybdenum disulfide. Nanostructures were fabricated on two-dimensional crystals of MoS2 and WSe2. Within followed analysis attention was paid to the photoluminescence properties. In the thesis transition metal dichalcogenides are reviewed and description of the modified process of preparation by micromechanical exfoliation is given.
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