Národní úložiště šedé literatury Nalezeno 2 záznamů.  Hledání trvalo 0.01 vteřin. 
Blind Image Deconvolution in STEM mode of Electron Microscope
Valterová, Eva ; Walek, Petr (oponent) ; Potočňák, Tomáš (vedoucí práce)
Blind image deconvolution is method, which restore the true image and point spread function simultaneously. The goal of this paper is to introduce several methods of blind deconvolution and find the optimal method for reconstruction of the true image and point spread function of images from scanning transmission electron microscope. The alternating minimization algorithm is assumed as the most convenient for blind deconvolution problem. Then it is modified and tested. The proposed algorithm properties are tested on artificially degraded data and the real data from scanning transmission electron microscope. The algorithm efficiency is evaluated by several evaluating criteria. The algorithm limitations are determined and its area of use is specified.
Blind Image Deconvolution in STEM mode of Electron Microscope
Valterová, Eva ; Walek, Petr (oponent) ; Potočňák, Tomáš (vedoucí práce)
Blind image deconvolution is method, which restore the true image and point spread function simultaneously. The goal of this paper is to introduce several methods of blind deconvolution and find the optimal method for reconstruction of the true image and point spread function of images from scanning transmission electron microscope. The alternating minimization algorithm is assumed as the most convenient for blind deconvolution problem. Then it is modified and tested. The proposed algorithm properties are tested on artificially degraded data and the real data from scanning transmission electron microscope. The algorithm efficiency is evaluated by several evaluating criteria. The algorithm limitations are determined and its area of use is specified.

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