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SMV-2016-20: Simulation of detection systems of scanning electron microscopes
Radlička, Tomáš ; Oral, Martin ; Rozbořil, Jakub
The analysis of the detection system of scanning electron microscopes produced by FEI Czech Republic was done for many setting of the electron optical system. The main goal was to analyze the detection mechanisms and to find optimal system setting for detection of the given part of signal electron spectrum. It is used for maximization of the material or topographical contrast.

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