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Národní úložiště šedé literatury Nalezeno 2 záznamů.  Hledání trvalo 0.01 vteřin. 
Method for Extending the Field of View for X-ray Computed Tomography with Submicron Resolution
 Zemek, Marek ; Chmelík, Jiří (oponent) ; Mézl, Martin (vedoucí práce)
Computed tomography is a tool for nondestructive evaluation of samples, commonly used in many industrial and scientific fields. Some tomographic devices produce images with sub-micrometer spatial resolution. The field of view of such devices can be very small, in the range of single millimeters or less. This restricts possible sizes of samples, which is a major limitation. Various field-of-view extension techniques exist which are able to overcome this restriction. In this thesis, a previously published technique was adapted and implemented specifically for the Rigaku Nano3DX X-Ray microscope. This technique almost doubles the lateral extent of the field of view without the need for a larger detector array. The approach was tested using both synthetic and real data, and its performance is evaluated subjectively and objectively, through visual inspection and image quality metrics. The evaluation is largely based on comparing images reconstructed using this method to ones acquired using a larger detector array. The field-of-view extension method yields faithful reconstructions of samples, comparable in quality to their larger-detector counterparts.
Úplný záznam
Method for Extending the Field of View for X-ray Computed Tomography with Submicron Resolution
 Zemek, Marek ; Chmelík, Jiří (oponent) ; Mézl, Martin (vedoucí práce)
Computed tomography is a tool for nondestructive evaluation of samples, commonly used in many industrial and scientific fields. Some tomographic devices produce images with sub-micrometer spatial resolution. The field of view of such devices can be very small, in the range of single millimeters or less. This restricts possible sizes of samples, which is a major limitation. Various field-of-view extension techniques exist which are able to overcome this restriction. In this thesis, a previously published technique was adapted and implemented specifically for the Rigaku Nano3DX X-Ray microscope. This technique almost doubles the lateral extent of the field of view without the need for a larger detector array. The approach was tested using both synthetic and real data, and its performance is evaluated subjectively and objectively, through visual inspection and image quality metrics. The evaluation is largely based on comparing images reconstructed using this method to ones acquired using a larger detector array. The field-of-view extension method yields faithful reconstructions of samples, comparable in quality to their larger-detector counterparts.
Úplný záznam

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