|
|
Biomedical applications of polycaprolactone nanofibrous mats
Dvořák, Pavel ; Přibyl,, Jan (referee) ; Zajíčková, Lenka (advisor)
The diploma thesis deals with the treatment of polycaprolactone (PCL) nanofibers. PCL fibers were subjected to the deposition of plasma amine polymers in a low pressure pulsed radiofrequency capacitively coupled discharge using cyclopropylamine monomer (CPA). Collagen as an extracellular matrix (ECM) protein was immobilized and cell proliferation on the modified nanofiber surface was monitored. Untreated PCL fibers were also subjected to the deposition of an antibacterial copper layer, and the fibers were characterized by scanning electron microscopy (SEM), X-ray photoelectron spectroscopy (XPS), and energy dispersive spectroscopy (EDX).
|
|
|
Application of metallic materials for selective growth
Němeček, Tomáš ; Rezek, Bohuslav (referee) ; Čechal, Jan (advisor)
The Si(100) surface and Ga surface phases up to 1 ML on their oxidation have been studied by XPS and LEED. The selective growth of Ga on the SiO2/Si structures fabricated by EBL has been analyzed using SEM and AFM methods. It was proved that Ga clusters grow in structures beside the oxide. The structure of alumina on Ni3Al(111) and NiAl(110) substrates was fully determined by combining the results of STM measurements and DFT simulations. It was determined the alumina/NiAl(110) does not form a suitable template for ordered Fe and Co clusters growth. However, the next research confirmed the alumina/Ni3Al(111) forms template appropriate to clusters growth purpose.
|
|
| |
|
| |
|
|
Hydrogen quantification by electron spectroscopy
Endstrasser, Zdeněk ; Polčák, Josef (referee) ; Čechal, Jan (advisor)
The absence of hydrogen in the photoelectron spectrum remains one of the greatest limitations of X-ray photoelectron spectroscopy. The main aim of this work is therefore to determine the concentration of hydrogen atoms in the near surface region of a sample. The REELS electron spectroscopic method based on quasi-elastic electron scattering is used for this purpose. The choice of this method was given mainly by the fact that the photoelectron spectrometers has an electron source in the basic equipment, so there is no requirement to purchase additional equipment. In our case, measurements were realized using the AXIS Supra photoelectron spectrometer in CEITEC laboratories. We were primarily focused on the study of polymer samples in this work. The gus cluster ion source was used for sputter cleaning of the sample surface. Then the XPS and REELS measurements were performed on such cleaned samples. The obtained data were subsequently evaluated, and the results discussed. The most important output of this work was to develop the methodology of detection and quantification of hydrogen atoms. However, the theoretical description of the methods used, and the appreciation of critical aspects associated with the use of the REELS method are also embraced. In particular, the effect of sample charging and electron dose on measurement results is discussed.
|
|
|
Noise, Transport and Structural Properties of High Energy Radiation Detectors Based on CdTe
Šik, Ondřej ; Lazar, Josef (referee) ; Navrátil, Vladislav (referee) ; Grmela, Lubomír (advisor)
Poptávka ze strany vesmírného výzkumu, zdravotnictví a bezpečnostního průmyslu způsobila v posledních letech zvýšený zájem o vývoj materiálů pro detekci a zobrazování vysokoenergetického záření. CdTe a jeho slitina CdZnTe. jsou polovodiče umožnují detekci záření o energiích v rozsahu 10 keV až 500 keV. Šířka zakázaného pásma u CdTe / CdZnTe je 1.46 -1.6 eV, což umožňuje produkci krystalů o vysoké rezistivitě (10^10-10^11 cm), která je dostačující pro použití CdTe / CdZnTe při pokojové teplotě. V mé práci byly zkoumány detektory CdTe/CdZnTe v různých stádiích jejich poruchovosti. Byly použity velmi kvalitní spektroskopické detektory, materiál s nižší rezistivitou a výraznou polarizací, detektory s asymetrií elektrických parametrů kontaktů a teplotně degenerované vzorky. Z výsledků analýzy nízkofrekvenčního šumu je patrný obecný závěr, že zvýšená koncentrace defektů způsobí změnu povahy původně monotónního spektra typu 1/f na spektrum s výrazným vlivem generačně-rekombinačních procesů. Další výrazná vlastnost degenerovaných detektorů a detektorů nižší kvality je nárůst spektrální hustoty šumu typu 1/f se vzrůstajícím napájecím napětí se směrnicí výrazně vyšší než 2. Strukturální a chemické analýzy poukázaly, že teplotní generace detektorů způsobuje difuzi kovu použitého při kontaktování a stopových prvků hlouběji do objemu krystalu. Část mé práce je věnována modifikaci povrchu svazkem argonových iontů a jejímu vlivu na chemické složení a morfologii povrchu.
|
|
|
Electrospun fibers based on PVDF and nylon
Černohorský, Petr ; Sobola, Dinara (referee) ; Papež, Nikola (advisor)
Polymer nanofibers used for the construction of triboelectric nanogenerator (TENG) and piezoelectric nanogenerator (PENG) are new and promising technologies for energy recovery. Thanks to the generation of electrical energy based on mechanical movement (deformation), these fibers can find application in the field of self-powered electronic devices. In this work, three nanofibrous structures of materials were prepared by electrostatic spinning: pure polyvinylidene fluoride (PVDF), pure polyamide-6 (PA6) and their mixed combination PVDF / PA6. Non-destructive analyzes such as Raman spectroscopy, FTIR, XPS and electron microscopy were used to study the properties of nanofibers. Analyzes confirmed the positive effect of electrostatic spinning of polymers on the support of the formation of highly polar crystalline -phase in PVDF and , -phase in PA6. The structure arrangement of the nanofibrous material and their defects were observed by scanning electron microscopy (SEM). Furthermore, the contact angle of the wettability of the liquid on the surface was measured for the materials, and the permittivity was measured to monitor the dielectric properties. The described results make the mixed material PVDF / PA6 very promising for further research in the field of nanogenerators and functional textiles.
|
|
|
Analysis of locally modified surfaces for selective growth of cobalt
Krajňák, Tomáš ; Bábor, Petr (referee) ; Čechal, Jan (advisor)
In this thesis the chemical composition of silicon substrates locally modified by focused gallium ion beam by X-ray photoelectron spectroscopy is determined. In order to determine the influence of focused ion beam, the sample comprising sputtered square areas with nominal depths in range of 1 to 10 nm was prepared. Next, the sample was heated to elevated temperatures (500 - 700 °C) to reveal changes in the sputtered areas induced by annealing. In this work by X-ray photoelectron spectrometer Kratos Supra and electron microscope Tescan LYRA3 with focused ion beam were used. From the measured spectra of the Si 2p and Ga 2p3/2 peaks measured as a function of nominal sputtering depth and annealing temperature the following main observations were obtained. First, there is the additional peak component in the Si 2p peak, which can be assigned to the amorphous silicon. The second important finding is that gallium can be removed from near surface volume by annealing at temperatures beyond 700 °C.
|
|
|
Morphology study of ultra thin layers by XPS analysis of multiple peaks of a single element
Pokorný, David ; Šik, Ondřej (referee) ; Polčák, Josef (advisor)
This diploma thesis deals with methodology of thin film thickness determination using X-ray radiation of silver anode which provides radiation with energy of 2984,3 eV. This energy is twice as high as the standard aluminium radiation which allows a measurement of new photoelectron lines with higher bonding energy and it also provides thanks to the higher photoelectron energy greater information depth. In order to get the right results it was necessary to calibrate the spectrometer Kratos Axis Supra in the silver anode mode first and found out the form of the transmission function. The determination of the thickness of the thin layer was demonstrated by the comparation of the ratio of different photoelectron lines intensities with the theoretical model. For that purpose was specifically used the Si 1s and Si 2p peak bound in the substrate in the Si-Si bonding or in the thin oxid layer in the Si-O bonding. The results show that for thin SiO2/Si film thickness determination is the best to use the intensity ratio of only one photoelectron line. A silver anode however provides greater information depth.
|
|
|
Epitaxial growth of cobalt islands via oxide mediated epitaxy
Stará, Veronika ; Kolíbal, Miroslav (referee) ; Čechal, Jan (advisor)
This bachelor thesis deals with preparation, growth and analysis of cobalt thin films. The films are formed on silicon (111) samples covered with a thin layer of native oxide SiO2. Cobalt thin films were prepared using oxide mediated epitaxy method with the effusion cell as a source of cobalt atoms. Composition and morphology of the resulting Co system was studied as a function of the annealing temperature. Another goal of this research was to determine the dependence of the final island shape on the amount of deposited material and substrate orientation. The prepared structures were analyzed using X-ray photoelectron spectroscopy, atomic force microscopy and scanning electron microscopy. To determine the thickness of subsurface islands the samples were etched in buffered hydrofluoric acid and analyzed using above mentioned methods.
|
guest ::
