National Repository of Grey Literature 5 records found  Search took 0.00 seconds. 
Resistivity measuring workplace for composite materials
Kucharčík, Jan ; Barath, Peter (referee) ; Vognar, Jiří (advisor)
This bachelor’s thesis is focused on exploring the characteristics of carbon allotropes. On constructed workspace resistivity of bulk samples will be measured according to the pressure. In conclusion, results of the measurement and proposals to improve the accuracy of the measuring methods are described.
Deposition and optical properties of thin films and layered structures by PECVD
Kucharčík, Jan ; Boušek, Jaroslav (referee) ; Čech, Vladimír (advisor)
Thesis in theoretical part is focused on the principle of spectroscopic ellipsometry and formation of thin films by plasma-enhanced chemical vapor deposition (PECVD). In the experimental part we describe the deposition system, ellipsometer and mathematical evaluation of ellipsometric data, materials used for film formation and processing of the samples. Single-layer and multilayer structures of polymeric materials were prepared. We revealed that the optical properties of thin films are independent of film thickness. We also described the effect of the effective power and deposition gas mixture on optical properties of thin films.
Resistivity measuring workplace for composite materials
Kucharčík, Jan ; Barath, Peter (referee) ; Vognar, Jiří (advisor)
This bachelor’s thesis is focused on exploring the characteristics of carbon allotropes. On constructed workspace resistivity of bulk samples will be measured according to the pressure. In conclusion, results of the measurement and proposals to improve the accuracy of the measuring methods are described.
Deposition and optical properties of thin films and layered structures by PECVD
Kucharčík, Jan ; Boušek, Jaroslav (referee) ; Čech, Vladimír (advisor)
Thesis in theoretical part is focused on the principle of spectroscopic ellipsometry and formation of thin films by plasma-enhanced chemical vapor deposition (PECVD). In the experimental part we describe the deposition system, ellipsometer and mathematical evaluation of ellipsometric data, materials used for film formation and processing of the samples. Single-layer and multilayer structures of polymeric materials were prepared. We revealed that the optical properties of thin films are independent of film thickness. We also described the effect of the effective power and deposition gas mixture on optical properties of thin films.

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