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Characterization of PVDF material in nanoscale resolution
Pisarenko, Tatiana ; Dallaev, Rashid (oponent) ; Sobola, Dinara (vedoucí práce)
This work deals with the characterization of nanofibers based on polyvinylidene fluoride. The focus is on the piezoelectric properties of the fiber, which are studied by piezoelectric force microscopy. Thus, two types of different samples were measured, which differed in the fabrication parameters. The differences in the fibers in their phase composition were also investigated using Raman spectroscopy and Fourier-transform infrared spectroscopy. Chemical analysis of the surface and its state was performed using X-ray photoelectron spectroscopy. The different arrangement of the nanofibers together with their cross-section was observed by a scanning electron microscope using focused ion beam. The wettability and contact angle of the surface of the samples with demineralized water were also examined. It was found that the higher speed of the roller during the electrospinning process has a very significant effect on their arrangement and thus on the parameters affecting the formation of the piezoelectric effect and other material properties.
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Elektrospřádaná vlákna na bázi PVDF a nylonu
Černohorský, Petr ; Sobola, Dinara (oponent) ; Papež, Nikola (vedoucí práce)
Polymerní nanovlákna využívané pro konstrukci triboelektrického nanogenerátoru (TENG) a piezoelektrického nanogenerátoru (PENG) jsou nové a perspektivní technologie pro získávání energie. Díky generování elektrické energie na základě mechanického pohybu (deformace) mohou tato vlákna najít uplatnění v oblasti samonapájených elektronických zařízení. V této práci byly pomocí elektrostatického zvlákňování připraveny tři nanovláknité struktury materiálů: čistý polyvinylidenfluorid (PVDF), čistý polyamid-6 (PA6) a jejich mísená kombinace PVDF/PA6. Pro studium vlastností nanovláken byly použity nedestruktivní analýzy jako Ramanova spektroskopie, FTIR, XPS a pozorování pomocí elektronového mikroskopu. Analýzy potvrdily pozitivní vliv elektrostatického zvlákňování polymerů na podporu tvorby vysoce polární krystalické -fáze u PVDF a , –fáze u PA6. Uspořádání struktury nanovláknitého materiálu a jejich defekty byly pozorovány rastrujícím elektronovým mikroskopem (SEM). Dále u materiálů byl měřen kontaktní úhel smáčivosti kapaliny na povrchu a bylo provedeno měření permitivity pro sledování dielektrických vlastností. Popsané výsledky činí mísený materiál PVDF/PA6 velice perspektivním pro další zkoumání v oblasti nanogenerátorů a funkčních textilů.
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Structural and electrical properties of PVDF-CNT composite
Misiurev, Denis ; Dallaev, Rashid (oponent) ; Sobola, Dinara (vedoucí práce)
Electrospininig has been proven one of the most popular and widely spreaded method of producing high quility of vibers with required parametrs. The quality and morfology of produced vibers is based on many parametrs such as humidity, doses of material, applied voltage etc. Limitations of ceramic piezomaterials (brittleness, toxicity of lead-containing samples, difficulties of complicated shapes preparations, etc.) forced the research in the field of piezoelectric polymers. One of them is polyvinylidene fluoride (PVDF). It could be prepared in various forms: thin films, bulk samples, fibers. PVDF fibers attract the most attention because of high flexibility, lightweight, mechanical stability, chemical inertness. Properties of PVDF fibers can be tuned using dopant material: ceramic particles, metal nanoparticles, graphite materials as graphene oxide or carbon nanotubes (CNT).
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Studium morfologie vysoce orientovaného pyrolytického grafitu ozářeného ionty argonu
Komínek, Josef ; Kaspar, Pavel (oponent) ; Sobola, Dinara (vedoucí práce)
Hlavním cílem bakalářské práce je studium povrchu vysoce uspořádaného pyrolytického grafitu (HOPG) pomocí mikroskopie atomárních sil a spektroskopie Raman a XPS. HOPG je vrstvený materiál: atomy každé vrstvy mezi sebou mají vazbu mnohem silnější než mezi atomy jiných vrstev. Široké aplikační možnosti HOPG vyžadují další studii. HOPG je široce využíváno v nanotechnologii a nanovýrobě. Vyžívá se v měřicí technice (standart skenovací sondové mikroskopie pro rozměry na atomární úrovni, monochromátory pro rentgenové záření, atd.) a k přípravě nanostrukturovaných vzorků. V rámci bakalářské práce byly vybrány vzorky ZYH-A kvalit. Aby bylo dosaženo skutečných 3D dat představujících informaci o vlastnostech povrchu, provedlo se měření pomocí AFM. Po studii povrchu pomocí AFM metod byl vyšetřen povrch HOPG pomocí polo-kontaktního a kontaktního režimu pro podrobnou analýzu topografie a dosažení nezkreslených dat bez vlivu artefaktu scénovaní. Praktická část ukazuje obrázky, které představují 3D topografii povrchu. Provedlo se skenování pomocí AFM na různých velikostech sledované oblasti. Jsou získávány parametry topografie povrchu. Pro tyto účely byl použit vlastní software mikroskopu. Zobrazuje se výškové rozložení povrchu na grafu. Charakteristika topografie povrchu je důležitá kvůli tomu, že jeho fyzikální a chemické vlastnosti povrchu nezávisí pouze na složení, ale i na jeho struktuře (topografii). Získané parametry drsnosti povrchu by měly být vzaty v úvahu při dalším studiím charakteristik povrchu.
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Defectoscopy of thin polymer layers using computer vision
Podstránský, Jáchym ; Sobola, Dinara (oponent) ; Knápek, Alexandr (vedoucí práce)
In the electron beam lithography process, one of the first steps is to coat the substrate, the wafer, with a thin layer of polymer resist. During the coating process, defects occur that can affect the exposure and therefore the functionality of the final nanostructure. By checking the quality of the deposited resin prior to exposure, these defect sites can be avoided. This process can be done manually using a light microscope, but it is a time consuming process. In the framework of this bachelor thesis, a device has been developed that can detect these defects automatically. It is a rasterising device that, by combining two stepper motors and an optical camera, takes images of the desired area of the wafer and then analyses these with the help of artificial intelligence. The user is then provided with a document in which the size, position and type of each defect found is recorded.
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Degradation of GaAs Solar Cells
Papež, Nikola ; Pinčík,, Emil (oponent) ; Lazar, Josef (oponent) ; Sobola, Dinara (vedoucí práce)
Gallium arsenide based solar cells are among the most powerful types of solar cells available. Their main advantage is excellent resistance to thermal and ionising radiation, and therefore they are used primarily in demanding conditions. This dissertation describes the state of GaAs photovoltaic cells exposed to thermal stress, high cooling, gamma radiation and broad-spectrum laser irradiation. The samples were examined before, after and during these processes using several analytical and characterisation methods. The measurements were focused on the characterisation of the surface, optical and electrical properties. Limits and new behaviour of this type of photovoltaic cells have been discovered, which are also affected by thin protective and anti-reflective layers.
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Energy dispersive X-ray spectroscopy of doped PVDF fibers
Smejkalová, Tereza ; Papež, Nikola (oponent) ; Sobola, Dinara (vedoucí práce)
This diploma thesis focuses on a flexible energy harvesting system based on piezoelectric polymer polyvinylidene fluoride (PVDF) with an emphasis on manipulating and optimising the properties and performance. By incorporating powders of piezo-active ceramics, the properties of piezoelectric polymer PVDF could be significantly improved and converted into useful electrical energy. PVDF was formed by electrospinning into fibres with a thickness of 1.5-0.3 µm and then studied with various analytical methods. This work offers a description of electrospinning, a preparation of samples for examination and a theoretical introduction to the analytical methods to which the samples were subjected. The morphology and distribution of the nanostructured ceramics into the PVDF polymer matrix was observed by scanning electron microscopy (SEM) and energy-dispersive Xray spectroscopy (EDX). For the formation of phase and detailed phase composition, the samples were comprehensively characterised by Fourier transform infrared spectroscopy (FTIR). The work also contains analysis in Raman spectroscopy, a method used to identify and compare chemical compounds. The electrical characteristics were studied by dielectric spectroscopy and the correlation with composition is provided. Individual components of doped fibres are characterised and discussed relating to their future use in sensors.
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Analysis and characterisation of spirally-arranged field-emission nanostructure
Ondříšková, Martina ; Sobola, Dinara (oponent) ; Knápek, Alexandr (vedoucí práce)
Cathodes containing arrays of high aspect ratio field emitters are of great interest as sources of electron beams for vacuum electronic devices. The desire to maximize current and current density leads to the design of denser arrays. However, denser arrays lead to undesirable field shielding effects caused by the presence of surrounding emitters in the array. To reduce the shielding effect and thus maximize the field enhancement, an array of emitters was designed with an arrangement inspired by the natural phenomenon of phyllotaxis. The structure thus designed was created using electron beam lithography and reactive ion etching to form micropillars. A black silicon etching technique was used to create ultra-sharp tips with a radius in the order of tens of nanometers on the top of each micropillar. Analysis of the sample topography was performed by Scanning electron microscopy. Ultraviolet photoelectron spectroscopy was used to determine the work function. To find out the emission properties of the fabricated structures, a Field emission microscope was constructed and its electron gun was modified to experimentally use the fabricated structure as the cathode. A Murphy-Good plot was used to analyze the field emission data, to which the orthodoxy test was applied to check the validity of the experimental I-V data. Current stability measurement was performed to observe current fluctuations.
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Non-Destructive Local Diagnostics of Optoelectronic Devices
Sobola, Dinara ; Pína,, Ladislav (oponent) ; Pinčík,, Emil (oponent) ; Tománek, Pavel (vedoucí práce)
To obtain novel materials for emerging optoelectronic devices, deeper insight into their structure is required. To achieve this, the development and application of new diagnostic methods is necessary. To contribute to these goals, this dissertation thesis is concerned with local diagnostics, including non-destructive mechanical, electrical and optical techniques for examining the surface of optoelectronic devices and materials. These techniques allows us to understand and improve the overall efficiency and reliability of optoelectronic device structures, which are generally degraded by defects, absorption, internal reflection and other losses. The main effort of the dissertation work is focused on the study of degradation phenomena, which are most often caused by both global and local heating, resulting in increased diffusion of ions and vacancies in the materials of interest. From a variety of optoelectronic devices, we have chosen two representative devices: a) solar cells - a large p-n junction device, and b) thin films - substrates for micro optoelectronic devices. In both cases we provide their detailed surface characterization. For the solar cells, scanning probe microscopy was chosen as the principal tool for non-destructive characterization of surface properties. This method is described, and both positive and negative aspects of the methods used are explained on the basis of literature review and our own experiments. An opinion on the use of probe microscopy applications to study solar cells is given. For the thin films, two interesting, from the stability point of view, materials were chosen as candidates for heterostructure preparation: sapphire and silicon carbide. The obtained data and image analysis showed a correlation between surface parameters and growth conditions for the heterostructures studied for optoelectronic applications. The thesis substantiates using these prospective materials to improve optoelectronic device performance, stability and reliability.
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Design of automated set-up intended for inspection of PMMA coated silicon wafers
Drozd, Michal ; Sobola, Dinara (oponent) ; Knápek, Alexandr (vedoucí práce)
During the coating the substrate with a thin layer of polymer resist several defects can to occur which could damage an exposure by electron beam lithography. The quality of the resist-coated surface prior to the exposure is also very important in terms of the final functionality of the fabricated micro device. The quality of the resist-coated surface can be measured by means of human visual inspection with a visible-light microscope. This bachelor's thesis is focused on the design and assembly of the automated set-up to do this inspection automatically. More precisely, the designed set-up is called WaferScan and it allows to scan a silicon wafer coated with a resist layer. The wafer surface is scanned with an optical camera and the taken images are analyzed using computer to determine the location and the size of the defects and the dust particles in the resist layer. The entire device consists of two moving axes, x and y, (that allow the movement of the camera) and a control electronic circuitry. Software to control the scanning device and the image processing tool were also developed.
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