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High-temperature X-ray Diffractometry of Thin Layers
Valeš, Václav ; Holý, Václav (advisor) ; Jergel, Matej (referee) ; Nižňanský, Daniel (referee)
In this work, the crystallographic structure and its changes under thermal treatment of different systems consisting of metal oxide nanoparticles is studied. The principal method used throughout the thesis is x-ray powder diffraction enriched with grazing incidence small angle x-ray scattering when the nanoparticles form an ordered structure or with x-ray absorption spectroscopy when additional information on local crystallographic structure is required. For all the systems the preparation conditions were optimized according to the crystallographic data for further applications.

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