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Design and set up of a laboratory sample of a laser deflectometer for measurement of mechanical stress within thin films
Šustek, Štěpán ; Klapetek,, Petr (referee) ; Ohlídal, Miloslav (advisor)
This diploma thesis describes the design of a device for measuring stress in thin films – laser deflectometer, realization of its design and its experimental testing. The thesis is divided into five chapters. The first chapter deals with the stress in thin films and its influence on substrate – thin film system. The second chapter provides an overview of devices widely used for measuring stress in thin films and describes some their advantages and disadvantages. In the third chapter some design possibilities of the device are presented. The final solution of device called deflectometr is introduced in the fourth chapter. The last chapter includes the functional testing the device.
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Design of a spectrometer accessory for absolute reflectance measurements
Šustek, Štěpán ; Antoš, Martin (referee) ; Klus, Jakub (advisor)
This paper describes the design and the design solution of an extension for measurement of an absolute reflectance using Perkin Elmer Lambda 45. This paper is divided into three parts. The first part deals with the basic theory of optics, knowledge of which is necessary for the proper function of the optical components used in the design. The second part provides an overview of configurations used in the practice to measure both the relative and the absolute reflectance. The last section includes the final design solution of the extension.
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Design and set up of a laboratory sample of a laser deflectometer for measurement of mechanical stress within thin films
Šustek, Štěpán ; Klapetek,, Petr (referee) ; Ohlídal, Miloslav (advisor)
This diploma thesis describes the design of a device for measuring stress in thin films – laser deflectometer, realization of its design and its experimental testing. The thesis is divided into five chapters. The first chapter deals with the stress in thin films and its influence on substrate – thin film system. The second chapter provides an overview of devices widely used for measuring stress in thin films and describes some their advantages and disadvantages. In the third chapter some design possibilities of the device are presented. The final solution of device called deflectometr is introduced in the fourth chapter. The last chapter includes the functional testing the device.
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Design of a spectrometer accessory for absolute reflectance measurements
Šustek, Štěpán ; Antoš, Martin (referee) ; Klus, Jakub (advisor)
This paper describes the design and the design solution of an extension for measurement of an absolute reflectance using Perkin Elmer Lambda 45. This paper is divided into three parts. The first part deals with the basic theory of optics, knowledge of which is necessary for the proper function of the optical components used in the design. The second part provides an overview of configurations used in the practice to measure both the relative and the absolute reflectance. The last section includes the final design solution of the extension.
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