National Repository of Grey Literature 1 records found  Search took 0.00 seconds. 

Warning: Requested record does not seem to exist.
SRAM memories testing with utilization of memory built-in-self-test
Sedlář, Jan ; Fujcik, Lukáš (referee) ; Hejátková, Edita (advisor)
The project deals with the testing of SRAM memories using method MBIST with the utilisation of sofware tool Tessent Memory BIST. The main purpose is to get familiar with memory testing and to create a design for testing on a specific chip which after its implementation on the chip will retain the original features and functions. Subsequently, the tool is evaluated on its usability.

Interested in being notified about new results for this query?
Subscribe to the RSS feed.