Home > Search Results: recid:253629
Search:
 
Search Tips :: Simple Search
Search collections:
Sort by: Display results: Output format:
National Repository of Grey Literature 1 records found  Search took 0.00 seconds. 

Could not find similar documents for this query.
Scanning very low energy electron microscopy for the characterization of polycrystalline metal samples
 Pokorná, Zuzana ; Knápek, Alexandr
We explored the possibility of a Scanning Electron Microscopy technique for the determination of crystallographic orientation, based on the measurement of the reflectivity of very low energy electrons. Our experiments are based on the concept that in the incident electron energy range 0–30 eV, electron reflectivity can be correlated with the electronic structure of the material, which varies with the local crystallographic orientation of the specimen.\nThe motivation for the development of this technique was to achieve a quick and highresolution means for determining the crystallographic orientation of very small grains in a polycrystalline material. The key limiting factor was the cleanliness of the sample surface and also the geometrical setup of the experiment.
Detailed record

Interested in being notified about new results for this query?
Subscribe to the RSS feed.
Digital Repository :: Search :: Submit :: Personalize :: Help
Powered by Invenio v1.1.2
Maintained by admin.invenio@techlib.cz
This site is also available in the following languages:
Česky  English