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Epitaxial growth of cobalt islands via oxide mediated epitaxy
Stará, Veronika ; Kolíbal, Miroslav (referee) ; Čechal, Jan (advisor)
This bachelor thesis deals with preparation, growth and analysis of cobalt thin films. The films are formed on silicon (111) samples covered with a thin layer of native oxide SiO2. Cobalt thin films were prepared using oxide mediated epitaxy method with the effusion cell as a source of cobalt atoms. Composition and morphology of the resulting Co system was studied as a function of the annealing temperature. Another goal of this research was to determine the dependence of the final island shape on the amount of deposited material and substrate orientation. The prepared structures were analyzed using X-ray photoelectron spectroscopy, atomic force microscopy and scanning electron microscopy. To determine the thickness of subsurface islands the samples were etched in buffered hydrofluoric acid and analyzed using above mentioned methods.
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Epitaxial growth of cobalt islands via oxide mediated epitaxy
Stará, Veronika ; Kolíbal, Miroslav (referee) ; Čechal, Jan (advisor)
This bachelor thesis deals with preparation, growth and analysis of cobalt thin films. The films are formed on silicon (111) samples covered with a thin layer of native oxide SiO2. Cobalt thin films were prepared using oxide mediated epitaxy method with the effusion cell as a source of cobalt atoms. Composition and morphology of the resulting Co system was studied as a function of the annealing temperature. Another goal of this research was to determine the dependence of the final island shape on the amount of deposited material and substrate orientation. The prepared structures were analyzed using X-ray photoelectron spectroscopy, atomic force microscopy and scanning electron microscopy. To determine the thickness of subsurface islands the samples were etched in buffered hydrofluoric acid and analyzed using above mentioned methods.
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Very Low Energy Scanning Electron Microscopy
Hrnčiřík, Petr
Main goal of the work is in-situ comparison of signals in slow and Auger electrons in Scanning Electron Microscope. Construction of experimental device, computer simulations and calculations of properties of the device and interpretation of getting data are parts of the work.
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An ultrahigh vacuum scanning low energy electron microscope for surface studies
Müllerová, Ilona ; Frank, Luděk
In the course of recent six years, a complex device for examination of clean and well-defined surfaces with low energy electrons under ultrahigh vacuum conditions has been developed and put into operation. The apparatus is intended for exploration of novel image contrasts, available at landing energies of the scanning primary beam below 100 eV, under a residual pressure in the specimen vicinity in the order of 10.sup.-10./sup. mbar. The instrument consists of three vacuum chambers: the observation chamber, a chamber for in-situ preparations and the loading chamber of the air lock.
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