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National Repository of Grey Literature 2 records found  Search took 0.01 seconds. 
Lead-Free Voids Cause Mechanisms and Influence on Reliability
 Šimon, Vojtěch ; Špinka, Jiří (referee) ; Starý, Jiří (advisor)
The aim of this work is to analyze reliability of lead-free solder join, in particular the voids generated during the soldering process. The main target of the theoretical part of the work is to isolate basic mechanisms of formation of the voids and optimize the soldering process. The practical part of the paper is based on monitoring the count and size of the voids in a solder join. An X-Ray tomograph has been chosen as a non-destructive method of detection. The statistical part of this work compares conventional soldering of the entire board with local soldering by IR radiation.
Detailed record
Lead-Free Voids Cause Mechanisms and Influence on Reliability
 Šimon, Vojtěch ; Špinka, Jiří (referee) ; Starý, Jiří (advisor)
The aim of this work is to analyze reliability of lead-free solder join, in particular the voids generated during the soldering process. The main target of the theoretical part of the work is to isolate basic mechanisms of formation of the voids and optimize the soldering process. The practical part of the paper is based on monitoring the count and size of the voids in a solder join. An X-Ray tomograph has been chosen as a non-destructive method of detection. The statistical part of this work compares conventional soldering of the entire board with local soldering by IR radiation.
Detailed record

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