Home > Search Results: keywords:"image resolutions"
Search:
Search Tips :: Advanced Search
Search collections:
Sort by: Display results: Output format:
National Repository of Grey Literature 1 records found  Search took 0.01 seconds. 
Zkoumání elektronických struktur a materiálů v rastrovacím nízko-energiovém elektronovém mikroskopu (SLEEM)
 Müllerová, Ilona ; Frank, Luděk
The SLEEM mode, available via moderate adaptation to a conventional SEM, is capable of providing the image resolution nearly constant over the full energy range from the primary beam energy down to even fractions of eV. In this way, one can enter multiple novel contrast mechanisms, directly visualizing details of crystallinic and electronic structure of the specimen, which are particularly important in development and diagnostics of nano-structured materials and devices
Detailed record

Interested in being notified about new results for this query?
Subscribe to the RSS feed.
Digital Repository :: Search :: Submit :: Personalize :: Help
Powered by Invenio v1.1.2
Maintained by admin.invenio@techlib.cz
This site is also available in the following languages:
Česky  English