Home > Search Results: keywords:"far-field spectroscopy"
Search:
Search Tips :: Advanced Search
Search collections:
Sort by: Display results: Output format:
National Repository of Grey Literature 2 records found  Search took 0.01 seconds. 
Measurement of resonant properties of plasmonic nanostructures in transmission and reflection mode of far-field spectroscopy
 Klement, Robert ; Brzobohatý, Oto (referee) ; Šikola, Tomáš (advisor)
Far-field optical spectroscopy allows for measurement of plasmonic resonances on metallic nanostructures of various shapes and sizes when illuminated by continuous light. Employing dark-field microscopy makes it possible to measure scattering on a localised plasmon excited on a single, isolated nanostructure. For the purpose of these measurements an apparatus based on commercial dual microscope system Nanonics has been put together. Experiments carried out during work on this thesis have shown a great sensitivity of the apparatus in its present form, allowing to measure a plasmonic resonance of a single nanoparticle. Proposed improvements of the apparatus should lead to even greater sensitivity and precision of measurements in the near future.
Detailed record
Measurement of resonant properties of plasmonic nanostructures in transmission and reflection mode of far-field spectroscopy
 Klement, Robert ; Brzobohatý, Oto (referee) ; Šikola, Tomáš (advisor)
Far-field optical spectroscopy allows for measurement of plasmonic resonances on metallic nanostructures of various shapes and sizes when illuminated by continuous light. Employing dark-field microscopy makes it possible to measure scattering on a localised plasmon excited on a single, isolated nanostructure. For the purpose of these measurements an apparatus based on commercial dual microscope system Nanonics has been put together. Experiments carried out during work on this thesis have shown a great sensitivity of the apparatus in its present form, allowing to measure a plasmonic resonance of a single nanoparticle. Proposed improvements of the apparatus should lead to even greater sensitivity and precision of measurements in the near future.
Detailed record

Interested in being notified about new results for this query?
Subscribe to the RSS feed.
Digital Repository :: Search :: Submit :: Personalize :: Help
Powered by Invenio v1.1.2
Maintained by admin.invenio@techlib.cz
This site is also available in the following languages:
Česky  English