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Diffusion x-ray reflection from rough multilayers
Cejpek, Petr ; Holý, Václav (advisor) ; Daniš, Stanislav (referee)
This bachelor work follows with the theory of diffusion x-ray scattering from rough multilayers. In the first chapter we will recap some basic principles - statitistic properties of interfaces, Fresnell coefficients, scattering theory, etc. - this stuff we will use to derive the expressions for specular reflection and diffusion scattering from rough interfaces, which we will consider as the random fractals. We will demonstrate the use of these derived expressions at a measurement on the multilayers coumpounded from and layers and substrate of mineral glass. Fitting of the measured data on the derived expressions will be done with Matlab software. Moreover, we will measure the roughness of interfaces with AFM microscope and we will compare these two measuring metodes. 2SiO 2ZrO
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Rtg difrakce a difuzní rozpyl na Heuslerových slitinách
Cejpek, Petr ; Holý, Václav (advisor)
Recently, Heusler alloys are studied for their interesting magnetic and electronic properties. These properties are strongly dependent on the crystallographic struc- ture. This work deals with Heusler alloys of the A2BC type. We have powder samples and single-crystaline samples for our study as well. An object of interest was a description of crystallographic structure of the samples, site occupation numbers of each type of atoms and their possible occupation disorder. Pow- der difraction and EXAFS have been measured on the powder samples. Clasical single-crystal diffractions has been meassured on the single-crystaline samples. In the case of a modulated structure in the samples, satelite difractions have been measured too. 1
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Rtg difrakce a difuzní rozpyl na Heuslerových slitinách
Cejpek, Petr ; Holý, Václav (advisor)
Recently, Heusler alloys are studied for their interesting magnetic and electronic properties. These properties are strongly dependent on the crystallographic struc- ture. This work deals with Heusler alloys of the A2BC type. We have powder samples and single-crystaline samples for our study as well. An object of interest was a description of crystallographic structure of the samples, site occupation numbers of each type of atoms and their possible occupation disorder. Pow- der difraction and EXAFS have been measured on the powder samples. Clasical single-crystal diffractions has been meassured on the single-crystaline samples. In the case of a modulated structure in the samples, satelite difractions have been measured too. 1
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Rtg difrakce a difuzní rozpyl na Heuslerových slitinách
Cejpek, Petr ; Holý, Václav (advisor) ; Kriegner, Dominik (referee)
Recently, Heusler alloys are studied for their interesting magnetic and electronic properties. These properties are strongly dependent on the crystallographic struc- ture. This work deals with Heusler alloys of the A2BC type. We have powder samples and single-crystaline samples for our study as well. An object of interest was a description of crystallographic structure of the samples, site occupation numbers of each type of atoms and their possible occupation disorder. Pow- der difraction and EXAFS have been measured on the powder samples. Clasical single-crystal diffractions has been meassured on the single-crystaline samples. In the case of a modulated structure in the samples, satelite difractions have been measured too. 1
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Diffusion x-ray reflection from rough multilayers
Cejpek, Petr ; Holý, Václav (advisor) ; Daniš, Stanislav (referee)
This bachelor work follows with the theory of diffusion x-ray scattering from rough multilayers. In the first chapter we will recap some basic principles - statitistic properties of interfaces, Fresnell coefficients, scattering theory, etc. - this stuff we will use to derive the expressions for specular reflection and diffusion scattering from rough interfaces, which we will consider as the random fractals. We will demonstrate the use of these derived expressions at a measurement on the multilayers coumpounded from and layers and substrate of mineral glass. Fitting of the measured data on the derived expressions will be done with Matlab software. Moreover, we will measure the roughness of interfaces with AFM microscope and we will compare these two measuring metodes. 2SiO 2ZrO
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