National Repository of Grey Literature 1 records found  Search took 0.00 seconds. 
Electron back-scattered diffraction as a method for grain boundary analysis in polycrystalline materials
Malachov, Martin ; Jäger, Aleš
Current development of analytical techniques in scanning electron microscopy allowed us to obtain precise information about the crystallography and chemical composition of materials. Aim of this work is to explain electron back-scatter diffraction (EBSD) technique and its utilization in grain characterization of polycrystalline materials.

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