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Preparation and characterization of SNOM probes
Robešová, Magdaléna ; Rovenská, Katarína (referee) ; Dvořák, Petr (advisor)
This Bachelor’s thesis is about the preparation of precision probes for Scanning Nearfield Optical Microscopy (SNOM) and its characteristics. Since SNOM probes influence the near electromagnetic field, the quality of their construction and their exact description is a key element for the valuable interpretation of measured data. The goal of this thesis is to grant literature research about SNOM, SNOM probes and their preparation process. Secondly, to produce and characterize the functional SNOM probes, which could then be used to detect optical interferences of Surface Plasmon Polaritons (SPPs).
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Interaction between SNOM tip and near-field
Krpenský, Jan ; Kvapil, Michal (referee) ; Dvořák, Petr (advisor)
Interaction between a probe for scanning near-field optical microscopy (SNOM) and near electromagnetic field is a fundamental problem, with its solution being a necessary condition for the correct interpretation of experimental data. This bachelor's thesis is aiming to thoroughly describe this problem and by precise manufacturing of our own SNOM probes help to reach solution of this problem. For this purpose, the detection of near-field generated by interference of surface plasmon polaritons (SPP) on square shape nanostructures is being used. This study has proven the dependence of SNOM probe sensitivity to near-field components on the size of a SNOM aperture.
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Preparation and characterization of SNOM probes
Robešová, Magdaléna ; Rovenská, Katarína (referee) ; Dvořák, Petr (advisor)
This Bachelor’s thesis is about the preparation of precision probes for Scanning Nearfield Optical Microscopy (SNOM) and its characteristics. Since SNOM probes influence the near electromagnetic field, the quality of their construction and their exact description is a key element for the valuable interpretation of measured data. The goal of this thesis is to grant literature research about SNOM, SNOM probes and their preparation process. Secondly, to produce and characterize the functional SNOM probes, which could then be used to detect optical interferences of Surface Plasmon Polaritons (SPPs).
|
|
|
Interaction between SNOM tip and near-field
Krpenský, Jan ; Kvapil, Michal (referee) ; Dvořák, Petr (advisor)
Interaction between a probe for scanning near-field optical microscopy (SNOM) and near electromagnetic field is a fundamental problem, with its solution being a necessary condition for the correct interpretation of experimental data. This bachelor's thesis is aiming to thoroughly describe this problem and by precise manufacturing of our own SNOM probes help to reach solution of this problem. For this purpose, the detection of near-field generated by interference of surface plasmon polaritons (SPP) on square shape nanostructures is being used. This study has proven the dependence of SNOM probe sensitivity to near-field components on the size of a SNOM aperture.
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