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National Repository of Grey Literature 2 records found  Search took 0.00 seconds. 
Meaurement process automatization of Zener reference
 Bábek, Tomáš ; Nováková Zachovalová, Věra (referee) ; Havlíková, Marie (advisor)
This thesis deals with metrology specialized to DC voltage. In the begining of thesis is explanation of technical terms from metrology, summarization of units from International System and explanation of the standards and its kinds in the context of metrology. Primary standards of DC voltage based on Zener diodes and Josephson effect are described as well. In cooperation with Czech metrology institute in Brno this work is focused on automatization of measuring Zener reference standards (ZRS). Goal of this project is to automatize the measuring of Zener reference standards and its relationship with Josephson voltage system using scanner. To do this, there is a need to find out offsets, that can develop on scanner's channels. There is a theoretical analysis of measuring made on the scanner and their uncertainties. Aim of the solution is computation of scanner channels offsets using everyday automatic measuring the system of Zener reference standards (ZRS). For measuring the LabView was used and for computing the data from measured values the Matlab was used. This thesis should short the time needed when measuring DC voltage references, measure values of DC voltage standards and set the scanner channels offsets. In the end there is a summarization of offsets measured on individual scanner channels.
Detailed record
Meaurement process automatization of Zener reference
 Bábek, Tomáš ; Nováková Zachovalová, Věra (referee) ; Havlíková, Marie (advisor)
This thesis deals with metrology specialized to DC voltage. In the begining of thesis is explanation of technical terms from metrology, summarization of units from International System and explanation of the standards and its kinds in the context of metrology. Primary standards of DC voltage based on Zener diodes and Josephson effect are described as well. In cooperation with Czech metrology institute in Brno this work is focused on automatization of measuring Zener reference standards (ZRS). Goal of this project is to automatize the measuring of Zener reference standards and its relationship with Josephson voltage system using scanner. To do this, there is a need to find out offsets, that can develop on scanner's channels. There is a theoretical analysis of measuring made on the scanner and their uncertainties. Aim of the solution is computation of scanner channels offsets using everyday automatic measuring the system of Zener reference standards (ZRS). For measuring the LabView was used and for computing the data from measured values the Matlab was used. This thesis should short the time needed when measuring DC voltage references, measure values of DC voltage standards and set the scanner channels offsets. In the end there is a summarization of offsets measured on individual scanner channels.
Detailed record

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