Home > Search Results: keywords:"GISAXS"
Search:
Search Tips :: Advanced Search
Search collections:
Sort by: Display results: Output format:
National Repository of Grey Literature 1 records found  Search took 0.00 seconds. 
High-temperature X-ray Diffractometry of Thin Layers
 Valeš, Václav ; Holý, Václav (advisor) ; Jergel, Matej (referee) ; Nižňanský, Daniel (referee)
In this work, the crystallographic structure and its changes under thermal treatment of different systems consisting of metal oxide nanoparticles is studied. The principal method used throughout the thesis is x-ray powder diffraction enriched with grazing incidence small angle x-ray scattering when the nanoparticles form an ordered structure or with x-ray absorption spectroscopy when additional information on local crystallographic structure is required. For all the systems the preparation conditions were optimized according to the crystallographic data for further applications.
Detailed record

Interested in being notified about new results for this query?
Subscribe to the RSS feed.
Digital Repository :: Search :: Submit :: Personalize :: Help
Powered by Invenio v1.1.2
Maintained by admin.invenio@techlib.cz
This site is also available in the following languages:
Česky  English