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National Repository of Grey Literature 3 records found  Search took 0.00 seconds. 
Study of the morphology of highly oriented pyrolytic graphite irradiated by argon ions
 Komínek, Josef ; Kaspar, Pavel (referee) ; Sobola, Dinara (advisor)
The main task of this bachelor’s degree work is study of highly oriented pyrolytic graphite (HOPG) using atomif force microscopy, Raman spectroscopy and XPS spectroscopy. HOPG is layered material: atoms in one layer have stronger bong between themselves than two atoms in two neighbouring layers. Wide application options require further study. HOPG is now commonly used in nano-industry. It is used as a dimension standard. HOPG of A quality was processed in this work. In order to get accurate 3D data of sample surface, AFM measuring was done. 3D models of surfaces of various sizes are made. For these purposes was used free AFM data tool. Height parameters are used to describe topography. Got parameters are important for further study.
Detailed record
Afm Of Hopg: Case Study Of Hopg Milling
 Komínek, Josef
The purpose of this work is study of highly oriented pyrolytic graphite (HOPG) processed by focused ion beam (FIB) using atomic force microscopy (AFM) and Raman spectroscopy. Due of its properties, HOPG have a promising potential and wide range of applications in nanotechnology. AFM demonstrates quality of the pattern created by FIB: topography of patterned area, shape of the edges, etc. Raman spectroscopy indicates defectiveness of the near surface area occurred due to FIB processing.
Detailed record
Study of the morphology of highly oriented pyrolytic graphite irradiated by argon ions
 Komínek, Josef ; Kaspar, Pavel (referee) ; Sobola, Dinara (advisor)
The main task of this bachelor’s degree work is study of highly oriented pyrolytic graphite (HOPG) using atomif force microscopy, Raman spectroscopy and XPS spectroscopy. HOPG is layered material: atoms in one layer have stronger bong between themselves than two atoms in two neighbouring layers. Wide application options require further study. HOPG is now commonly used in nano-industry. It is used as a dimension standard. HOPG of A quality was processed in this work. In order to get accurate 3D data of sample surface, AFM measuring was done. 3D models of surfaces of various sizes are made. For these purposes was used free AFM data tool. Height parameters are used to describe topography. Got parameters are important for further study.
Detailed record

See also: similar author names
7 Komínek, Jan
2 Komínek, Jaromír
4 Komínek, Jiří
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