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Comprehensive methodology for non-destructive microanalysis of colour layers and micro-traces
Hradil, David ; Grygar, Tomáš ; Bezdička, Petr ; Kotrlý, M. ; Hradilová, J. ; Kolář, P. ; Turková, I. ; Svoboda, M. ; Kurková, H. ; Grünwaldová, Veronika ; Bláhová, Anna
Comprehensive methodology for non-destructive forensic expert examinations of microscopic samples of colour layers (i.e. fragments of lacquer systems in a broad sense, and similar materials) has been created. This comprehensive methodology encompasses sample preparation as polished sections and microtome slices, and subsequent set of non-destructive analytical methods (based on SEM, EDS, XRD, FTIR, optical microscopy and pattern analysis), which lead to identification and comparison of materials in one sample (without its exhausting or irreversible modifications). Implementation of this system into forensic-technical expert casework allows realisation of some types of expert examinations and, first and foremost, maintaining probative value of the evidence (with respect to non-destructive microanalytical procedures), primarily in terms of explaining crimes of extreme gravity in the field of violent and organized crime.
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