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Characterization of the perovskit photovoltaic cells
Kaliyev, Alexey ; Jandová, Kristýna (referee) ; Novák, Vítězslav (advisor)
The work is focused on problems of perovskite photovoltaic cells. The theoretical part describes the properties of perovskite structure, its composition and use in solar cells. There is also a brief information on silicon-based solar cells, which is followed by a comparison of the two systems. The measurement methods, which this stated and described here are used to understand problematics photovoltaic, determination of efficiency, stability and durability of the solar cell. In the practical part will focus on the application of these methods, discussion and evaluation of results.
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Semiconductors structures , charge collection method
Golda, Martin ; Čudek, Pavel (referee) ; Špinka, Jiří (advisor)
This thesis treats about semiconducting silicon structures. It describes the characteristics of the element and creation of P and N type of semiconductor and discusses about different types of faults in the crystal lattice. It deals with the description of methods for monitoring faults in semiconductor ie. determining the properties of semiconductors via EBIC, EBIV and CC methods, which are used for analysis of semiconductor devices and materials. Determining the properties of silicon components is being done by generation of charge carriers in the sample loaded in chamber of the scanning electron microscope by high energy electrons. Bellow the sample surface is being generated an electric charge which is being collected by probes. Using this data obtained by EBIC and CC were evaluated diffusion length and lifetime of electrons.
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Functionalized nanostructures
Váňa, Rostislav ; Kvapil, Michal (referee) ; Kolíbal, Miroslav (advisor)
This thesis deals with functionalized nanoparticles. In the first part there are mentioned materials suitable for a functionalization, the usage of functionalized nanoparticles in medicine and biochemistry and detection methods of changes of optical properties. In the second part changes of optical properties after functionalization are investigated by spectroscopic ellipsometry and FTIR spectroscopy.
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Study of microdefects in Czochralski silicon
Španělová, Klára ; Cába, Vladislav (referee) ; Másilko, Jiří (advisor)
The bachelor's thesis deals with the study of microdefects in Czochralski silicon in cooperation with the company onsemi Rožnov pod Radhoštěm. The main objectiv is to find knowledge about microdefects in Czochralski silicon and their influence on the properties of semiconductor components. The experimental part deals with the characterization of microdefects in Czochralski silicon ingots doped by B, P and Sb and grown in the company onsemi. Specifically, the measurement of radial resistivity is performance using a four-point probe with subsequent conversion to dopant concentration (according to ASTM F 723-99). The radial and axial distribution of microdefects in Czochralski silicon ingots is evaluated using the precipitation test and the OISF test. The position of the vacant-interstitial interface was also detected as part of microdefect study.
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Ecological liquidation of photovoltaic cells and modules
Demchikhin, Sergey ; Veselý, Aleš (referee) ; Vaněk, Jiří (advisor)
The first part of this master’s thesis contain the history of photovoltaic technology and types of PV cells. Gave a consideration to advantages and disadvantages of solar cells. Compared their effectiveness and important parameters. In the next part described the recycling technology of modules at the end of their lifetime. Described certain recycled materials. At the end of the work described possible improvements to existing technologies used for encapsulating of cell. And wich would improve the recycling process.
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Advanced techniques of micromachining
Šalomoun, Vojtěch ; Prášek, Jan (referee) ; Pekárek, Jan (advisor)
Fabrication of micro-electro-mechanical systems (MEMS) requires advanced level of miniaturization, which is not achievable by technology used in microeletronics. Socalled micromachining covers many unique techniques of material processing to get microstructures with possible dimensions below 1 m. This bachelor’s thesis gives a general introduce to micromachining of MEMS. Its focus is on bulk and surface micromachining by wet and dry etching. The practical part contains design of microstructures, their manufacturing process and creation of computer models in CoventorWare suite.
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System for electroluminiscence defect detection of solar cells
Marčík, Silvestr ; Jandová, Kristýna (referee) ; Vaněk, Jiří (advisor)
The master thesis focuses primarily on issues of photovoltaic cells in terms of their defects. The introductory part deals with the history of photovoltaics, their introduction into practice and finally an explanation of the photoelectric effect itself. The thesis also describes photovoltaic cells themselves. It explains their principle, advantages, disadvantages and the creation of photovoltaic systems. A substantial part of the work is focused on the topic of detection of defects using luminescent methods. Subsequently, it describes procedural defects arising from the improper handling of already manufactured products. The final part deals with the main topic of the work, which is a detection using luminescence methods and it also mentions the non-luminescence method LBIC. The practical part of the master thesis contains the analysis of the current solution and of the subsequent proposal of solution using a low cost camera. It describes how to modify the camera, verify its spectral sensitivity using a spectrometer and measure the sensitivity of the CMOS sensor. The conclusion is focused on verifying the functionality of the proposed solution on different sources of infrared radiation and photovoltaic panels themselves.
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Elimination of defects in Si substrates by Rapid Thermal Process application
Frantík, Ondřej ; Hégr, Ondřej (referee) ; Szendiuch, Ivan (advisor)
Low cost, rapid and high thermal by IR heating, rapid cooling and high efficiency, there are RTP (Rapid Thermal Processing) properties. We can use RTP for annealing, diffusion, contacting, oxidation and others. Rapid temperature change and IR heating can be followed positive effects in the silicon substrate. This paper is focused on annealing by RTP. Wafers were p-type monocrystalline CZ silicon with different bulk minority carrier lifetime. Minority carrier lifetime was measured by MW-PCD (Microwave Photoconductance Decay) before and after thermal processing.
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