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LPE Growth of III-V Semiconductors from rare-earth Treated Melts
Grym, Jan ; Procházková, Olga ; Zavadil, Jiří ; Žďánský, Karel
We focus on the characterization of InP and InGaAsP layers prepared by liquid phase epitaxy with rare-earth admixtures. We applied photoluminescence spectroscopy (PL), capacitance-voltage measurements, and secondary ion mass spectroscopy in order to explain: (i) the gettering effect and conductivity crossover of InP layers for Pr treated samples, (ii) narrowing of the PL and elecroluminescent spectra of the active InGaAsP region of a double-heterostructure LED.

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