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National Repository of Grey Literature 2 records found  Search took 0.01 seconds. 
Self-sensing SPM probes for measuring electrical properties of materials
 Očkovič, Adam ; Vařeka, Karel (referee) ; Pavera, Michal (advisor)
The bachelor's thesis is focused on the modification of probes with an integrated sensor usable for measuring conductivity characteristics of surfaces in atomic force microscopy. The first part presents the theory concerning atomic force microscopy, conductivity measurement and deposition using an ion beam. Furthermore, the method of production and limitation of the use of electrically conductive probes with optically read deflection is described. The practical part presents the main problems of probes with integrated sensors in conductivity measurements. Furthermore, the modification of the probes themselves, the measurements made with these probes and suggestions for improving the properties of the probes are described.
Detailed record
Self-sensing SPM probes for measuring electrical properties of materials
 Očkovič, Adam ; Vařeka, Karel (referee) ; Pavera, Michal (advisor)
The bachelor's thesis is focused on the modification of probes with an integrated sensor usable for measuring conductivity characteristics of surfaces in atomic force microscopy. The first part presents the theory concerning atomic force microscopy, conductivity measurement and deposition using an ion beam. Furthermore, the method of production and limitation of the use of electrically conductive probes with optically read deflection is described. The practical part presents the main problems of probes with integrated sensors in conductivity measurements. Furthermore, the modification of the probes themselves, the measurements made with these probes and suggestions for improving the properties of the probes are described.
Detailed record

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