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Superconductive property and microstructure of MgB2/Al composite materials
Matsuda, K. ; Mizutani, M. ; Nishimura, K. ; Kawabata, T. ; Hishinuma, Y. ; Aoyama, S. ; Müllerová, Ilona ; Frank, Luděk ; Ikeno, S.
Scanning low energy electron microscopy (SLEEM) is a useful tool for observation of insulating samples and determination of microstructure on a specimen surface. In the present work, we have applied the SLEEM to examine the microstructure contrast between boride particles and Al matrix.

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