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Evaporation of thin films using intense laser light observed operando in a scanning electron microscope
Boleloucká, Eliška ; Ukropcová, Iveta (referee) ; Nováček, Zdeněk (advisor)
This work focuses on the modification of the sample surface using intense laser light. This is one of the desired features of the new generation of multifunctional SPM probes, which are under development. In the first chapter is introduced the SPM probe itself, which allows correlative measurements. Following section contains the implementation of the intense laser light into the electron microscope chamber, together with the modification made to the detection branch of the microscope. The COMSOL Multiphysics software environment is used to simulate the interaction of the laser light with the sample surface. The results of the simulations of the temperature field in the sample are then compared with the results of the direct interaction of the sample surface with the laser light in the electron microscope chamber.

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