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Study of metals by low voltage SEM
Ligas, Aleš ; Jánský, Pavel (referee) ; Mikmeková, Šárka (advisor)
The aim of this thesis is to demonstrate the advantages of the scanning low energy electron microscopy (SLEEM) in the field of materials science. The SLEEM can be very effectively used for investigation of wide range of materials, such as steels, alloys, ceramics and thin films. Experimental part of this work was performed on the scanning electron microscope TESCAN VEGA TS 5310 equipped with cathode lens mode at Institute of Scientific Instruments of the ASCR, v.v.i..

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