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Přístroj pro měření koncentračních profilů – Analýza výstupních dat
Čermák, Jiří ; Stloukal, Ivo
In this paper, a new modification of a commercial apparatus Edwards Coating system E306A is described that enables to perform diffusion measurements with radioactive tracers. The plan-parallel thin layers are removed by sputtering with Ar+ ions and the well defined fraction of the sputtered-off material is sequentially collected. The function of the apparatus is exemplified by the measurement of bulk diffusion coefficient of 65Zn in Fe40Ni40B20 alloy at T = 684 K.

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