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Usage Local Light Radiation for the Diagnostic Method of Photovoltaic Cells
Dolenský, Jan ; Šály, Vladimír (referee) ; Unčovský,, Marek (referee) ; Vaněk, Jiří (advisor)
This thesis is focused on the area of analysis and diagnostic of monocrystalline solar cells, using local light radiation. Main goals of this thesis are focused on explanation of generation and behavior microplasma in solar cell, in dependence of temperature and reversed bias voltage. As a next focus of this thesis is strong regions of microplasma sources, analyzed by scanning electron microscope and a detailed analysis of edge and surface structure is made. The influence of the environment (air pressure, level of vacuum and nitrogen gas) on the microplasma generation and behavior is observed in the vacuum chamber of electron microscope. The results from microplasma method are correlated with noise diagnostic method and on the base of these results are set a new thesis and mathematical equations for the defects behavior in different conditions. The outcomes of the research are shared with the manufacturer od silicon solar cells, Solartec s.r.o. company. It is the advanced diagnostic methods that allow improving the quality of the production process, through early detection of individual groups of defects.
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Usage Local Light Radiation for the Diagnostic Method of Photovoltaic Cells
Dolenský, Jan ; Šály, Vladimír (referee) ; Unčovský,, Marek (referee) ; Vaněk, Jiří (advisor)
This thesis is focused on the area of analysis and diagnostic of monocrystalline solar cells, using local light radiation. Main goals of this thesis are focused on explanation of generation and behavior microplasma in solar cell, in dependence of temperature and reversed bias voltage. As a next focus of this thesis is strong regions of microplasma sources, analyzed by scanning electron microscope and a detailed analysis of edge and surface structure is made. The influence of the environment (air pressure, level of vacuum and nitrogen gas) on the microplasma generation and behavior is observed in the vacuum chamber of electron microscope. The results from microplasma method are correlated with noise diagnostic method and on the base of these results are set a new thesis and mathematical equations for the defects behavior in different conditions. The outcomes of the research are shared with the manufacturer od silicon solar cells, Solartec s.r.o. company. It is the advanced diagnostic methods that allow improving the quality of the production process, through early detection of individual groups of defects.
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