Original title: Reduction Of Metal Artefacts In Ct Data With Submicron Resolution Using Dual-Target Ct
Authors: Víteček, Jakub ; Šalplachta, Jiří
Document type: Papers
Language: eng
Publisher: Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologií
Abstract: The article deals with the possibility of the metal artefact reduction in computed tomography (CT) data with submicron resolution using dual-target CT. The sample is scanned twice at different acquisition parameters, at two different energy spectra. Dual-energy data are then used for easier localisation and segmentation of metal areas and the final combination of low and high-density materials. The final images are compared with the projection-based metal artefact reduction (MAR) algorithm and the commercial program VGStudio MAX 3.1. The results show good functionality of the proposed method and potential for further development.
Keywords: CT images artefacts; Dual-Target CT; Nanotomography; Reduction of metal artefacts; Submicron resolution; X-ray computed tomography
Host item entry: Proceedings of the 25st Conference STUDENT EEICT 2019, ISBN 978-80-214-5735-5

Institution: Brno University of Technology (web)
Document availability information: Fulltext is available in the Brno University of Technology Digital Library.
Original record: http://hdl.handle.net/11012/186701

Permalink: http://www.nusl.cz/ntk/nusl-678512


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