Original title: Design Of A Semi-Automatic Positioning System For Measuring Of Semiconductor Chips
Authors: Kotian, Tomáš
Document type: Papers
Language: cze
Publisher: Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologií
Abstract: The aim of this work is to design a semi-automatic positioning system for the testof semiconductor chips. The work solves the problems with the implementation of the constructionto achieve the highest possible accuracy for contacting with probe card. Next, the work deals withthe selection of a suitable control unit for stepper motors and finally to create a program to controlthe system and display image from the camera to the computer. The last requirement for the programis detection of chips with the camera image and automatic centering with a probe card.
Keywords: LabWIEW; probecards; Semi-automatic positioning system for chip test; TMCM-6110
Host item entry: Proceedings I of the 27st Conference STUDENT EEICT 2021: General papers, ISBN 978-80-214-5942-7

Institution: Brno University of Technology (web)
Document availability information: Fulltext is available in the Brno University of Technology Digital Library.
Original record: http://hdl.handle.net/11012/200706

Permalink: http://www.nusl.cz/ntk/nusl-677798


The record appears in these collections:
Universities and colleges > Public universities > Brno University of Technology
Conference materials > Papers