Original title: Coincidence imaging System with Electron Optics
Authors: Kroupa, M. ; Jakoubek, J. ; Krejčí, E. ; Valach, O. ; Horáček, Miroslav ; Radlička, Tomáš ; Vlček, Ivan
Document type: Papers
Conference/Event: International workshop on radiation imaging detectors /11./, Praha (CZ), 2009-06-26 / 2009-07-02
Year: 2009
Language: eng
Abstract: Instrumental neutron activation analysis (INAA) is a widely used method for elemental analysis. After the sample is put into a neutron field, where nuclei of interest become activated, these nuclei emit gamma photons with characteristic energies for each element. By measuring gamma spectrum of the activated sample one can determine the sample elemental composition with very high precision. In order to find out the spatial distribution of elements, the sample is usually cut into pieces, which are examined individually. Such procedure is time consuming and the spatial resolution is limited by the size of the pieces. This contribution follows up the work where the semiconductor pixel detector Timepix was used for revealing the concentration and distribution of certain elements in a whole sample at once (imaging coincidence INAA) [1]. Photons detected by a standard semiconductor detector were used to trigger the Timepix device which detected the accompanying electrons.
Keywords: coincidence imaging system; instrumental neutron activation analysis; Timepix
Project no.: CEZ:AV0Z20650511 (CEP)
Host item entry: 11th International Workshop on Radiation Imaging Detectors, ISBN 978-80-01-04378-3

Institution: Institute of Scientific Instruments AS ČR (web)
Document availability information: Fulltext is available at the institute of the Academy of Sciences.
Original record: http://hdl.handle.net/11104/0180986

Permalink: http://www.nusl.cz/ntk/nusl-41097


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