Home > Conference materials > Papers > Preliminary balistic electron emission microscopy/spectroscopy characterization of InAs quantum dots in AlGaAs/GaAs heterostructure
Original title:
Preliminary balistic electron emission microscopy/spectroscopy characterization of InAs quantum dots in AlGaAs/GaAs heterostructure
Authors:
Vaniš, Jan ; Henini, M. ; Šroubek, Filip ; Walachová, Jarmila Document type: Papers Conference/Event: NANO'03, Brno (CZ), 2003-10-21 / 2003-10-23
Year:
2003
Language:
eng Abstract:
We presented a characterization of InAs self assembled quantum dots embedded in quantum well of the AlGaAs/GaAs heterostructure using ballistic electron emission microscopy/spectroscopy BEEM/BEES. Structures are grown by MBE. Results of spectroscopic measurements "on the dot" and "out of the dot" are also presented.
Keywords:
electro-optical devices; materials; measurement; quantum well devices; spectroscopy Project no.: CEZ:AV0Z2067918 (CEP), KSK1010104 Projekt 04/01:4045 (CEP) Funding provider: GA AV ČR Host item entry: International Conference NANO'03. Proceedings
Institution: Institute of Photonics and Electronics AS ČR
(web)
Document availability information: Fulltext is available at the institute of the Academy of Sciences. Original record: http://hdl.handle.net/11104/0114381