Home > Conference materials > Papers > Imaging of Non-Conducting Specimens by Noncharging Scanning Electron Microscopy with Method for Automatically Adjusted Critical Energies
Original title:
Imaging of Non-Conducting Specimens by Noncharging Scanning Electron Microscopy with Method for Automatically Adjusted Critical Energies
Authors:
Zadražil, Martin ; Frank, Luděk ; Norris, John Document type: Papers Conference/Event: Recent Trends /6./ in Charged Particle Optics and Surface Physics Instrumentation, Skalský Dvůr (CZ), 1998-06-29 / 1998-07-03
Year:
1998
Language:
eng Project no.: CP93/12283 Funding provider: CEC Host item entry: Recent Trends in Charged Particle Optics and Surface Physics Instrumentation - 6th Seminar, ISBN 80-238-2333-7
Institution: Institute of Scientific Instruments AS ČR
(web)
Document availability information: Fulltext is available at the institute of the Academy of Sciences. Original record: http://hdl.handle.net/11104/0100609